ISBN: 9787030474261 - 原子探针显微学 (1 risultati)
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Da: liu xing, Nanjing, JS, Cinaliu xing
Contatta il venditoreVenditore con 5 stelleCondizione: Nuovo
EUR 146,34
EUR 16,11 spedizioneSpedito da Cina a U.S.A.Quantità: 3 disponibili
paperback. Condizione: New. Paperback. Pub Date: 2016-03-01 Pages: 326 Language: Chinese Publisher: science press co. LTD. the atom probe microscopy includes theoretical basis. practical aspects of atom probe and its application in material science three parts. first summarizes the development course of atom probe technology. introduces the prototype of atom probe field from.…
