ISBN: 9787111187066 - 数字集成电路与嵌入式内核系统的测试设计 (1 risultati)

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Da: liu xing, Nanjing, JS, Cinaliu xing
Contatta il venditoreVenditore con 5 stelleCondizione: Nuovo
EUR 66,30
EUR 16,13 spedizioneSpedito da Cina a U.S.A.Quantità: 1 disponibile
paperback. Condizione: New. Paperback. Pub Date: 2006 05 of Pages: 284 in Publisher: Machinery Industry Press. digital integrated circuits with embedded kernel system test design (with CD) discusses the integrated circuit with embedded digital systems testing technology. and put forward many important and key solutions. Practical problems encountered in testing embedded cores and SoC test problems are discussed from the investment cost of the technology and products. Digital integrated circuits and embedded kernel syste.…