Isbn: 9787115521279 - c 陷阱与缺陷 (1 risultati)

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Da: liu xing, Nanjing, JS, Cinaliu xing
Contatta il venditoreVenditore con 5 stelleCondizione: Nuovo
EUR 77,95
EUR 15,67 spedizioneSpedito da Cina a U.S.A.Quantità: 3 disponibili
paperback. Condizione: New. Paperback. Pub Date: 2020-08-01 Pages: 174 Language: Chinese Publisher: People's Posts and Telecommunications Publishing House C Trap and Defects The author based on a paper he published in Bell Labs in 1985. combined with his own work Experience expands this paper into a classic work of precious value to C programmers.?The starting point of this book is not to criticize the C language. but to help C programmers bypass the traps and obstacles in the programming process.?C Traps and Defects is.…