9787122465535 - integrated circuit design and integrated systems -- digital integrated circuit testing and design for testability(chinese edition) di shan dan (1 risultati)
- Brossura
Da: liu xing, Nanjing, JS, Cinaliu xing
Contatta il venditoreVenditore con 5 stelleCondizione: Nuovo
EUR 101,73
EUR 15,54 spedizioneSpedito da Cina a U.S.A.Quantità: 1 disponibili
paperback. Condizione: New. Language:Chinese.Paperback. Pub Date: 2024-11 Pages: 190 Publisher: Chemical Industry Press This book starts with the basic concepts of digital integrated circuit testing and design for testability. systematically introducing the concepts. principles. and methods of digital integrated circuit testing.… Main contents include: fundamentals of digital integrated circuit testing. test vector generation. design for testability and scan testing. boundary scan testing. built-in self-test. memory test.
