9787302374442 (1 risultati)
- Brossura
Da: liu xing, Nanjing, JS, Cinaliu xing
Contatta il venditoreVenditore con 5 stelleCondizione: Nuovo
EUR 64,18
EUR 15,85 spedizioneSpedito da Cina a U.S.A.Quantità: 5 disponibili
paperback. Condizione: New. Pub Date: 2014-09-01 Language: Chinese Publisher: Tsinghua University Press' material modern testing methods. including X-ray diffraction analysis. electron microscopy analysis of two parts. the main contents include: X-ray diffraction equation and strength. and more crystal X-ray diffraction analysis… methods and analyzer. qualitative and quantitative phase analysis. to accurately determine the crystal lattice parameters. TEM imaging principle structure. electron diffraction. image contrast. .
