Isbn: 9787505388758 - guidance of modern digital logic test(chinese edition) (1 risultati)

paperback. Condizione: New. Paperback. Pub Date: 2003 08 Pages: 133 Language: Chinese in Publisher: Publishing House of Electronics Industry. Learning from the textbook: modern digital logic circuit experiment guidance in basic experiments of digital circuits. arranged TTL integrated logic gate function with parameters test combinational logic circuit design and test data selection and its application. decoder and its application to trigger its application. the counter and its application. shift registers. and its appli.…