9787519836641 - development history of iec and ieee high voltage and high current test standards(chinese edition) di guo ji da dian wang wei yuan hui d1.35 gong zuo zu , fan jian bin , li peng , yin yu deng yi (1 risultati)
Development History of IEC and IEEE High Voltage and High Current Test Standards(Chinese Edition)
GUO JI DA DIAN WANG WEI YUAN HUI D1.35 GONG ZUO ZU . FAN JIAN BIN . LI PENG . YIN YU DENG YI
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Da: liu xing, Nanjing, JS, Cinaliu xing
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paperback. Condizione: New. Paperback.Pub Date:2019-09 Pages:64 Language:Chinese Publisher:China Electric Power Press The authors have tried to clarify the difficulties in interpreting some standard clauses in the Development History of IEC\IEEE High Voltage and High Current Test Standards as much as possible. The revision of th…ese clauses in the future can make the high voltage test standards clearer and more user-friendly. The Development History of IEC\IEEE High Voltage and High Current Test Standards first introduce.
