9787560336480 - 半导体物理与测试分析 (1 risultati)
- Brossura
Da: liu xing, Nanjing, JS, Cinaliu xing
Contatta il venditoreVenditore con 5 stelleCondizione: Nuovo
EUR 48,82
EUR 15,42 spedizioneSpedito da Cina a U.S.A.Quantità: 1 disponibili
paperback. Condizione: New. Paperback. Pub Date: 2012 08 Pages: 152 Language: Chinese in Publisher: Harbin Institute of Technology Electronics and Communication Engineering Series: semiconductor physics test analysis more comprehensive introduction to the basics of semiconductor physics test analysis. Mainly includes: the basic…nature of the semiconductor; semiconductor impurity and defect levels. and silicon dislocations and stacking fault observed; statistical distribution of the carriers in the equilibrium state semi.
