Isbn: 9787560336480 - 半导体物理与测试分析 (1 risultati)

paperback. Condizione: New. Paperback. Pub Date: 2012 08 Pages: 152 Language: Chinese in Publisher: Harbin Institute of Technology Electronics and Communication Engineering Series: semiconductor physics test analysis more comprehensive introduction to the basics of semiconductor physics test analysis. Mainly includes: the basic nature of the semiconductor; semiconductor impurity and defect levels. and silicon dislocations and stacking fault observed; statistical distribution of the carriers in the equilibrium state semi.…