Condizione: Brand New. New. US edition. Expediting shipping for all USA and Europe orders excluding PO Box. Excellent Customer Service.
Da: Ria Christie Collections, Uxbridge, Regno Unito
EUR 117,13
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Aggiungi al carrelloCondizione: New. In.
Da: Books Puddle, New York, NY, U.S.A.
Condizione: New. pp. 272.
Da: AHA-BUCH GmbH, Einbeck, Germania
EUR 114,36
Quantità: 2 disponibili
Aggiungi al carrelloBuch. Condizione: Neu. Druck auf Anfrage Neuware - Printed after ordering - Model based testing is the most powerful technique for testing hardware and software systems. Models in Hardware Testing describes the use of models at all the levels of hardware testing. The relevant fault models for nanoscaled CMOS technology are introduced, and their implications on fault simulation, automatic test pattern generation, fault diagnosis, memory testing and power aware testing are discussed. Models and the corresponding algorithms are considered with respect to the most recent state of the art, and they are put into a historical context by a concluding chapter on the use of physical fault models in fault tolerance.
Da: Mispah books, Redhill, SURRE, Regno Unito
EUR 191,02
Quantità: 1 disponibili
Aggiungi al carrelloHardcover. Condizione: Like New. LIKE NEW. SHIPS FROM MULTIPLE LOCATIONS. book.
Da: Brook Bookstore On Demand, Napoli, NA, Italia
EUR 86,24
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Aggiungi al carrelloCondizione: new. Questo è un articolo print on demand.
Da: BuchWeltWeit Ludwig Meier e.K., Bergisch Gladbach, Germania
EUR 106,99
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Aggiungi al carrelloBuch. Condizione: Neu. This item is printed on demand - it takes 3-4 days longer - Neuware -Model based testing is the most powerful technique for testing hardware and software systems. Models in Hardware Testing describes the use of models at all the levels of hardware testing. The relevant fault models for nanoscaled CMOS technology are introduced, and their implications on fault simulation, automatic test pattern generation, fault diagnosis, memory testing and power aware testing are discussed. Models and the corresponding algorithms are considered with respect to the most recent state of the art, and they are put into a historical context by a concluding chapter on the use of physical fault models in fault tolerance. 257 pp. Englisch.
Da: moluna, Greven, Germania
EUR 93,00
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Aggiungi al carrelloGebunden. Condizione: New. Dieser Artikel ist ein Print on Demand Artikel und wird nach Ihrer Bestellung fuer Sie gedruckt. Introduction of model based hardware testingDescribes fault models for nanoscaled CMOS technologyFault simulation, ATPG and diagnosis algorithms for complex fault modelsComprehensive treatment including memory and low power aspects.
Da: Majestic Books, Hounslow, Regno Unito
EUR 155,21
Quantità: 4 disponibili
Aggiungi al carrelloCondizione: New. Print on Demand pp. 272 52:B&W 6.14 x 9.21in or 234 x 156mm (Royal 8vo) Case Laminate on White w/Gloss Lam.
Da: Biblios, Frankfurt am main, HESSE, Germania
EUR 154,95
Quantità: 4 disponibili
Aggiungi al carrelloCondizione: New. PRINT ON DEMAND pp. 272.