9789048197248 - low-power high-resolution analog to digital converters: design, test and calibration di zjajo, amir; pineda de gyvez, jose (10 risultati)
Lingua: Inglese
Editore: Springer, 2010
Serie: Libro 25 di 124 - Analog Circuits and Signal Processing
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Da: Basi6 International, Irving, TX, U.S.A.Basi6 International
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EUR 60,44
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Condizione: Brand New. New. Delivery takes 25-30 days. Excellent Customer Service.
Lingua: Inglese
Editore: Springer, 2010
Serie: Libro 25 di 124 - Analog Circuits and Signal Processing
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Da: Ria Christie Collections, Uxbridge, Regno UnitoRia Christie Collections
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Condizione: New. In.
Lingua: Inglese
Editore: Springer, 2010
Serie: Libro 25 di 124 - Analog Circuits and Signal Processing
- Rilegato
Da: Books Puddle, New York, NY, U.S.A.Books Puddle
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Condizione: New. pp. 316.
Lingua: Inglese
Editore: Springer, 2010
Serie: Libro 25 di 124 - Analog Circuits and Signal Processing
- Rilegato
Da: AHA-BUCH GmbH, Einbeck, GermaniaAHA-BUCH GmbH
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Buch. Condizione: Neu. Druck auf Anfrage Neuware - Printed after ordering - With the fast advancement of CMOS fabrication technology, more and more signal-processing functions are implemented in the digital domain for a lower cost, lower power consumption, higher yield, and higher re-configurability. This has recently generated…a great demand for low-power, low-voltage A/D converters that can be realized in a mainstream deep-submicron CMOS technology. However, the discrepancies between lithography wavelengths and circuit feature sizes are increasing. Lower power supply voltages significantly reduce noise margins and increase variations in process, device and design parameters. Consequently, it is steadily more difficult to control the fabrication process precisely enough to maintain uniformity. The inherent randomness of materials used in fabrication at nanoscopic scales means that performance will be increasingly variable, not only from die-to-die but also within each individual die. Parametric variability will be compounded by degradation in nanoscale integrated circuits resulting in instability of parameters over time, eventually leading to the development of faults. Process variation cannot be solved by improving manufacturing tolerances; variability must be reduced by new device technology or managed by design in order for scaling to continue. Similarly, within-die performance variation also imposes new challenges for test methods.In an attempt to address these issues, Low-Power High-Resolution Analog-to-Digital Converters specifically focus on: i) improving the power efficiency for the high-speed, and low spurious spectral A/D conversion performance by exploring the potential of low-voltage analog design and calibration techniques, respectively, and ii) development of circuit techniques and algorithms to enhance testing and debugging potential to detect errors dynamically, to isolate and confine faults, and to recover errors continuously. The feasibility of the described methods has been verified by measurementsfrom the silicon prototypes fabricated in standard 180nm, 90nm and 65nm CMOS technology.
Lingua: Inglese
Editore: Springer, 2010
Serie: Libro 25 di 124 - Analog Circuits and Signal Processing
- Rilegato
Da: Mispah books, Redhill, SURRE, Regno UnitoMispah books
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Hardcover. Condizione: Like New. LIKE NEW. SHIPS FROM MULTIPLE LOCATIONS. book.
Lingua: Inglese
Editore: Springer, 2010
Serie: Libro 25 di 124 - Analog Circuits and Signal Processing
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- Print on Demand
Da: Brook Bookstore On Demand, Napoli, NA, ItaliaBrook Bookstore On Demand
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Condizione: new. Questo è un articolo print on demand.
Lingua: Inglese
Editore: SPRINGER NATURE Nov 2010, 2010
Serie: Libro 25 di 124 - Analog Circuits and Signal Processing
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- Print on Demand
Da: BuchWeltWeit Ludwig Meier e.K., Bergisch Gladbach, GermaniaBuchWeltWeit Ludwig Meier e.K.
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Buch. Condizione: Neu. This item is printed on demand - it takes 3-4 days longer - Neuware -With the fast advancement of CMOS fabrication technology, more and more signal-processing functions are implemented in the digital domain for a lower cost, lower power consumption, higher yield, and higher re-configurability. This has rec…ently generated a great demand for low-power, low-voltage A/D converters that can be realized in a mainstream deep-submicron CMOS technology. However, the discrepancies between lithography wavelengths and circuit feature sizes are increasing. Lower power supply voltages significantly reduce noise margins and increase variations in process, device and design parameters. Consequently, it is steadily more difficult to control the fabrication process precisely enough to maintain uniformity. The inherent randomness of materials used in fabrication at nanoscopic scales means that performance will be increasingly variable, not only from die-to-die but also within each individual die. Parametric variability will be compounded by degradation in nanoscale integrated circuits resulting in instability of parameters over time, eventually leading to the development of faults. Process variation cannot be solved by improving manufacturing tolerances; variability must be reduced by new device technology or managed by design in order for scaling to continue. Similarly, within-die performance variation also imposes new challenges for test methods.In an attempt to address these issues, Low-Power High-Resolution Analog-to-Digital Converters specifically focus on: i) improving the power efficiency for the high-speed, and low spurious spectral A/D conversion performance by exploring the potential of low-voltage analog design and calibration techniques, respectively, and ii) development of circuit techniques and algorithms to enhance testing and debugging potential to detect errors dynamically, to isolate and confine faults, and to recover errors continuously. The feasibility of the described methods has been verified by measurements from the silicon prototypes fabricated in standard 180nm, 90nm and 65nm CMOS technology. 293 pp. Englisch.
Lingua: Inglese
Editore: Springer, 2010
Serie: Libro 25 di 124 - Analog Circuits and Signal Processing
- Rilegato
- Print on Demand
Da: Majestic Books, Hounslow, Regno UnitoMajestic Books
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EUR 78,90
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Condizione: New. Print on Demand pp. 316 Illus.
Lingua: Inglese
Editore: Springer, 2010
Serie: Libro 25 di 124 - Analog Circuits and Signal Processing
- Rilegato
- Print on Demand
Da: Biblios, frankfurt am main, HESSE, GermaniaBiblios
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EUR 80,74
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Condizione: New. PRINT ON DEMAND pp. 316.
Lingua: Inglese
Editore: Springer Netherlands, 2010
Serie: Libro 25 di 124 - Analog Circuits and Signal Processing
- Rilegato
- Print on Demand
Da: moluna, Greven, Germaniamoluna
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Gebunden. Condizione: New. Dieser Artikel ist ein Print on Demand Artikel und wird nach Ihrer Bestellung fuer Sie gedruckt. Unique combination of design, test, debugging and calibration of A/D converters (probably only on the market)Numerous examples and easy to follow procedure for design, test, debugging and calibration of A/D… convertersBoth state-of-the art software and hardw.
