9789400789739 - accelerating test, validation and debug of high speed serial interfaces di fan, yongquan; zilic, zeljko (11 risultati)
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Da: Books Puddle, New York, NY, U.S.A.Books Puddle
Contatta il venditoreVenditore con 4 stelleCondizione: Nuovo
EUR 146,70
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Condizione: New. pp. 208.
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Da: preigu, Osnabrück, Germaniapreigu
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EUR 95,25
EUR 70,00 spedizioneSpedito da Germania a U.S.A.Quantità: 5 disponibili
Taschenbuch. Condizione: Neu. Accelerating Test, Validation and Debug of High Speed Serial Interfaces | Yongquan Fan (u. a.) | Taschenbuch | xii | Englisch | 2014 | Springer | EAN 9789400789739 | Verantwortliche Person für die EU: Springer Verlag GmbH, Tiergartenstr. 17, 69121 Heidelberg, juergen[dot]hartmann[at]springer[dot]com… | Anbieter: preigu.
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Da: AHA-BUCH GmbH, Einbeck, GermaniaAHA-BUCH GmbH
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EUR 112,77
EUR 61,62 spedizioneSpedito da Germania a U.S.A.Quantità: 1 disponibili
Taschenbuch. Condizione: Neu. Druck auf Anfrage Neuware - Printed after ordering - High-Speed Serial Interface (HSSI) devices have become widespread in communications, from the embedded to high-performance computing systems, and from on-chip to a wide haul. Testing of HSSIs has been a challenging topic because of signal integrit…y issues, long test time and the need of expensive instruments. Accelerating Test, Validation and Debug of High Speed Serial Interfaces provides innovative test and debug approaches and detailed instructions on how to arrive to practical test of modern high-speed interfaces.Accelerating Test, Validation and Debug of High Speed Serial Interfaces first proposes a new algorithm that enables us to perform receiver test more than 1000 times faster. Then an under-sampling based transmitter test scheme is presented. The scheme can accurately extract the transmitter jitter and finish the whole transmitter test within 100ms, while the test usually takes seconds. The book also presents and external loopback-based testing scheme, where and FPGA-based BER tester and a novel jitter injection technique are proposed. These schemes can be applied to validate, test and debug HSSIs with data rate up to 12.5Gbps at a lower test cost than pure ATE solutions. In addition, the book introduces an efficieng scheme to implement high performance Gaussian noise generators, suitable for evaluating BER performance under noise conditions.
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Da: Revaluation Books, Exeter, Regno UnitoRevaluation Books
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EUR 173,21
EUR 11,72 spedizioneSpedito da Regno Unito a U.S.A.Quantità: 1 disponibili
Paperback. Condizione: Brand New. 2011 edition. 208 pages. 9.25x6.10x0.23 inches. In Stock.
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- Print on Demand
Da: Brook Bookstore On Demand, Napoli, NA, ItaliaBrook Bookstore On Demand
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EUR 86,24
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Condizione: new. Questo è un articolo print on demand.
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Da: Basi6 International, Irving, TX, U.S.A.Basi6 International
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EUR 100,37
Spedizione gratuitaSpedito in U.S.A.Quantità: 10 disponibili
Condizione: Brand New. New. US edition. Print on demand title. Delivery takes 20-25 days. Excellent Customer Service.
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Da: BuchWeltWeit Ludwig Meier e.K., Bergisch Gladbach, GermaniaBuchWeltWeit Ludwig Meier e.K.
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EUR 106,99
EUR 23,00 spedizioneSpedito da Germania a U.S.A.Quantità: 2 disponibili
Taschenbuch. Condizione: Neu. This item is printed on demand - it takes 3-4 days longer - Neuware -High-Speed Serial Interface (HSSI) devices have become widespread in communications, from the embedded to high-performance computing systems, and from on-chip to a wide haul. Testing of HSSIs has been a challenging topic because of… signal integrity issues, long test time and the need of expensive instruments. Accelerating Test, Validation and Debug of High Speed Serial Interfaces provides innovative test and debug approaches and detailed instructions on how to arrive to practical test of modern high-speed interfaces.Accelerating Test, Validation and Debug of High Speed Serial Interfaces first proposes a new algorithm that enables us to perform receiver test more than 1000 times faster. Then an under-sampling based transmitter test scheme is presented. The scheme can accurately extract the transmitter jitter and finish the whole transmitter test within 100ms, while the test usually takes seconds. The book also presents and external loopback-based testing scheme, where and FPGA-based BER tester and a novel jitter injection technique are proposed. These schemes can be applied to validate, test and debug HSSIs with data rate up to 12.5Gbps at a lower test cost than pure ATE solutions. In addition, the book introduces an efficieng scheme to implement high performance Gaussian noise generators, suitable for evaluating BER performance under noise conditions. 208 pp. Englisch.
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- Print on Demand
Da: moluna, Greven, Germaniamoluna
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EUR 92,27
EUR 48,99 spedizioneSpedito da Germania a U.S.A.Quantità: Più di 20 disponibili
Condizione: New. Dieser Artikel ist ein Print on Demand Artikel und wird nach Ihrer Bestellung fuer Sie gedruckt. Detailed instructions on achieving practical test of modern high-speed interfacesSelf-contained, with the background and tutorial includedExplains statistical measures of confidence and the ways to arrive at themYong…quan Fan.
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Da: Majestic Books, Hounslow, Regno UnitoMajestic Books
Contatta il venditoreVenditore con 4 stelleCondizione: Nuovo
EUR 151,56
EUR 7,62 spedizioneSpedito da Regno Unito a U.S.A.Quantità: 4 disponibili
Condizione: New. Print on Demand pp. 208.
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Da: Biblios, frankfurt am main, HESSE, GermaniaBiblios
Contatta il venditoreVenditore con 4 stelleCondizione: Nuovo
EUR 153,22
EUR 9,95 spedizioneSpedito da Germania a U.S.A.Quantità: 4 disponibili
Condizione: New. PRINT ON DEMAND pp. 208.
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Da: buchversandmimpf2000, Emtmannsberg, BAYE, Germaniabuchversandmimpf2000
Contatta il venditoreVenditore con 5 stelleCondizione: Nuovo
EUR 106,99
EUR 60,00 spedizioneSpedito da Germania a U.S.A.Quantità: 1 disponibili
Taschenbuch. Condizione: Neu. This item is printed on demand - Print on Demand Titel. Neuware -High-Speed Serial Interface (HSSI) devices have become widespread in communications, from the embedded to high-performance computing systems, and from on-chip to a wide haul. Testing of HSSIs has been a challenging topic because of sig…nal integrity issues, long test time and the need of expensive instruments. Accelerating Test, Validation and Debug of High Speed Serial Interfaces provides innovative test and debug approaches and detailed instructions on how to arrive to practical test of modern high-speed interfaces.Accelerating Test, Validation and Debug of High Speed Serial Interfaces first proposes a new algorithm that enables us to perform receiver test more than 1000 times faster. Then an under-sampling based transmitter test scheme is presented. The scheme can accurately extract the transmitter jitter and finish the whole transmitter test within 100ms, while the test usually takes seconds. The book also presents and external loopback-based testing scheme, where and FPGA-based BER tester and a novel jitter injection technique are proposed. These schemes can be applied to validate, test and debug HSSIs with data rate up to 12.5Gbps at a lower test cost than pure ATE solutions. In addition, the book introduces an efficieng scheme to implement high performance Gaussian noise generators, suitable for evaluating BER performance under noise conditions.Springer-Verlag KG, Sachsenplatz 4-6, 1201 Wien 208 pp. Englisch.
