Isbn: 9789402413656 - 3d flash memories (12 risultati)

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    • Lingua: Inglese

      Editore: Springer, 2018

      9402413650 / 9789402413656

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      Da: preigu, Osnabrück, Germaniapreigu

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      EUR 149,10

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      Taschenbuch. Condizione: Neu. 3D Flash Memories | Rino Micheloni | Taschenbuch | xxii | Englisch | 2018 | Springer | EAN 9789402413656 | Verantwortliche Person für die EU: Springer Verlag GmbH, Tiergartenstr. 17, 69121 Heidelberg, juergen[dot]hartmann[at]springer[dot]com | Anbieter: preigu.

    • Lingua: Inglese

      Editore: Springer, 2018

      9402413650 / 9789402413656

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      Da: AHA-BUCH GmbH, Einbeck, GermaniaAHA-BUCH GmbH

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      EUR 239,31

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      Taschenbuch. Condizione: Neu. Druck auf Anfrage Neuware - Printed after ordering - This book walks the reader through the next step in the evolution of NAND flash memory technology, namely the development of 3D flash memories, in which multiple layers of memory cells are grown within the same piece of silicon. It describes their working principles, device architectures, fabrication techniques and practical implementations, and highlights why 3D flash is a brand new technology.After reviewing market trends for both NAND and solid state drives (SSDs), the book digs into the details of the flash memory cell itself, covering both floating gate and emerging charge trap technologies. There is a plethora of different materials and vertical integration schemes out there. New memory cells, new materials, new architectures (3D Stacked, BiCS and P-BiCS, 3D FG, 3D VG, 3D advanced architectures); basically, each NAND manufacturer has its own solution. Chapter 3 to chapter 7 offer a broad overview of how 3D can materialize. The 3D wave is impacting emerging memories as well and chapter 8 covers 3D RRAM (resistive RAM) crosspoint arrays. Visualizing 3D structures can be a challenge for the human brain: this is way all these chapters contain a lot of bird's-eye views and cross sections along the 3 axes.The second part of the book is devoted to other important aspects, such as advanced packaging technology (i.e. TSV in chapter 9) and error correction codes, which have been leveraged to improve flash reliability for decades. Chapter 10 describes the evolution from legacy BCH to the most recent LDPC codes, while chapter 11 deals with some of the most recent advancements in the ECC field. Last but not least, chapter 12 looks at 3D flash memories from a system perspective. Is 14nm the last step for planar cells Can 100 layers be integrated within the same piece of silicon Is 4 bit/cell possible with 3D Will 3D be reliable enough for enterprise and datacenter applications These are some of the questions that this book helps answering by providing insights into 3D flash memory design, process technology and applications.

    • Lingua: Inglese

      Editore: Springer, 2018

      9402413650 / 9789402413656

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      Da: Revaluation Books, Exeter, Regno UnitoRevaluation Books

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      EUR 250,93

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      Paperback. Condizione: Brand New. reprint edition. 380 pages. 9.25x6.10x0.91 inches. In Stock.

    • Lingua: Inglese

      Editore: Springer, 2018

      9402413650 / 9789402413656

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      Da: Books Puddle, New York, NY, U.S.A.Books Puddle

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      EUR 329,38

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      Condizione: New. pp. 380.

    • Lingua: Inglese

      Editore: Springer, 2018

      9402413650 / 9789402413656

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      Da: Mispah books, Redhill, SURRE, Regno UnitoMispah books

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      EUR 299,26

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      Paperback. Condizione: New. NEW. SHIPS FROM MULTIPLE LOCATIONS. book.

    • Lingua: Inglese

      Editore: Springer, 2018

      9402413650 / 9789402413656

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      Da: Revaluation Books, Exeter, Regno UnitoRevaluation Books

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      EUR 310,13

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      Paperback. Condizione: Brand New. reprint edition. 380 pages. 9.25x6.10x0.91 inches. In Stock.

    • Lingua: Inglese

      Editore: Springer, 2018

      9402413650 / 9789402413656

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      Da: Brook Bookstore On Demand, Napoli, NA, ItaliaBrook Bookstore On Demand

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      EUR 134,27

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      Condizione: new. Questo è un articolo print on demand.

    • Lingua: Inglese

      Editore: Springer Netherlands, 2018

      9402413650 / 9789402413656

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      Da: moluna, Greven, Germaniamoluna

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      EUR 146,12

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      Condizione: New. Dieser Artikel ist ein Print on Demand Artikel und wird nach Ihrer Bestellung fuer Sie gedruckt. The first book to focus on 3D flash memoriesProvides details of flash 3D architectures which have never been published before, including a number of 3D cross sections Offers unique coverage of flash with Through-Silicon-Via (.

    • Lingua: Inglese

      Editore: Springer Netherlands, Springer Netherlands Jun 2018, 2018

      9402413650 / 9789402413656

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      Da: BuchWeltWeit Ludwig Meier e.K., Bergisch Gladbach, GermaniaBuchWeltWeit Ludwig Meier e.K.

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      EUR 171,19

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      Taschenbuch. Condizione: Neu. This item is printed on demand - it takes 3-4 days longer - Neuware -This book walks the reader through the next step in the evolution of NAND flash memory technology, namely the development of 3D flash memories, in which multiple layers of memory cells are grown within the same piece of silicon. It describes their working principles, device architectures, fabrication techniques and practical implementations, and highlights why 3D flash is a brand new technology.After reviewing market trends for both NAND and solid state drives (SSDs), the book digs into the details of the flash memory cell itself, covering both floating gate and emerging charge trap technologies. There is a plethora of different materials and vertical integration schemes out there. New memory cells, new materials, new architectures (3D Stacked, BiCS and P-BiCS, 3D FG, 3D VG, 3D advanced architectures); basically, each NAND manufacturer has its own solution. Chapter 3 to chapter 7 offer a broad overview of how 3D can materialize. The 3D wave is impacting emerging memories as well and chapter 8 covers 3D RRAM (resistive RAM) crosspoint arrays. Visualizing 3D structures can be a challenge for the human brain: this is way all these chapters contain a lot of bird's-eye views and cross sections along the 3 axes.The second part of the book is devoted to other important aspects, such as advanced packaging technology (i.e. TSV in chapter 9) and error correction codes, which have been leveraged to improve flash reliability for decades. Chapter 10 describes the evolution from legacy BCH to the most recent LDPC codes, while chapter 11 deals with some of the most recent advancements in the ECC field. Last but not least, chapter 12 looks at 3D flash memories from a system perspective. Is 14nm the last step for planar cells Can 100 layers be integrated within the same piece of silicon Is 4 bit/cell possible with 3D Will 3D be reliable enough for enterprise and datacenter applications These are some of the questions that this book helps answering by providing insights into 3D flash memory design, process technology and applications. 404 pp. Englisch.

    • Lingua: Inglese

      Editore: Springer Netherlands, Springer Jun 2018, 2018

      9402413650 / 9789402413656

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      Da: buchversandmimpf2000, Emtmannsberg, BAYE, Germaniabuchversandmimpf2000

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      EUR 171,19

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      Taschenbuch. Condizione: Neu. This item is printed on demand - Print on Demand Titel. Neuware -This book walks the reader through the next step in the evolution of NAND flash memory technology, namely the development of 3D flash memories, in which multiple layers of memory cells are grown within the same piece of silicon. It describes their working principles, device architectures, fabrication techniques and practical implementations, and highlights why 3D flash is a brand new technology.After reviewing market trends for both NAND and solid state drives (SSDs), the book digs into the details of the flash memory cell itself, covering both floating gate and emerging charge trap technologies. There is a plethora of different materials and vertical integration schemes out there. New memory cells, new materials, new architectures (3D Stacked, BiCS and P-BiCS, 3D FG, 3D VG, 3D advanced architectures); basically, each NAND manufacturer has its own solution. Chapter 3 to chapter 7 offer a broad overview of how 3D can materialize. The 3D wave is impacting emerging memories as well and chapter 8 covers 3D RRAM (resistive RAM) crosspoint arrays. Visualizing 3D structures can be a challenge for the human brain: this is way all these chapters contain a lot of bird¿s-eye views and cross sections along the 3 axes.The second part of the book is devoted to other important aspects, such as advanced packaging technology (i.e. TSV in chapter 9) and error correction codes, which have been leveraged to improve flash reliability for decades. Chapter 10 describes the evolution from legacy BCH to the most recent LDPC codes, while chapter 11 deals with some of the most recent advancements in the ECC field. Last but not least, chapter 12 looks at 3D flash memories from a system perspective.Is 14nm the last step for planar cells Can 100 layers be integrated within the same piece of silicon Is 4 bit/cell possible with 3D Will 3D be reliable enough for enterprise and datacenter applications These are some of the questions that this book helps answering by providing insights into 3D flash memory design, process technology and applications.Springer-Verlag GmbH, Tiergartenstr. 17, 69121 Heidelberg 404 pp. Englisch.

    • Lingua: Inglese

      Editore: Springer, 2018

      9402413650 / 9789402413656

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      Da: Majestic Books, Hounslow, Regno UnitoMajestic Books

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      EUR 311,61

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      Condizione: New. Print on Demand pp. 380.

    • Lingua: Inglese

      Editore: Springer, 2018

      9402413650 / 9789402413656

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      Da: Biblios, frankfurt am main, HESSE, GermaniaBiblios

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      EUR 315,90

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      Condizione: New. PRINT ON DEMAND pp. 380.