ISBN: 9789811093210 - high-level estimation and exploration of reliability for multi-processor system-on-chip (13 risultati)

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Condizione: New. In English.

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Condizione: New. pp. 217.

Taschenbuch. Condizione: Neu. Druck auf Anfrage Neuware - Printed after ordering - This book introduces a novel framework for accurately modeling the errors in nanoscale CMOS technology and developing a smooth tool flow at high-level design abstractions to estimate and mitigate the effects of errors. The book presents novel techniques for high-level fault simulation and reliability estimation as well as architecture-level and system-level fault tolerant designs. It also presents a survey of state-of-the-art problems and solutions, offering insights into reliability issues in digital design and their cross-layer countermeasures.…

Paperback. Condizione: Brand New. reprint edition. 197 pages. 9.25x6.10x0.47 inches. In Stock.

Taschenbuch. Condizione: Neu. High-level Estimation and Exploration of Reliability for Multi-Processor System-on-Chip | Zheng Wang (u. a.) | Taschenbuch | Computer Architecture and Design Methodologies | xx | Englisch | 2018 | Springer | EAN 9789811093210 | Verantwortliche Person für die EU: Springer Verlag GmbH, Tiergartenstr. 17, 69121 Heidelberg, juergen[dot]hartmann[at]springer[dot]com | Anbieter: preigu. …

Condizione: new. Questo è un articolo print on demand.

Taschenbuch. Condizione: Neu. This item is printed on demand - it takes 3-4 days longer - Neuware -This book introduces a novel framework for accurately modeling the errors in nanoscale CMOS technology and developing a smooth tool flow at high-level design abstractions to estimate and mitigate the effects of errors. The book presents novel techniques for high-level fault simulation and reliability estimation as well as architecture-level and system-level fault tolerant designs. It also presents a survey of state-of-the-art problems and solutions, offering insights into reliability issues in digital design and their cross-layer countermeasures. 220 pp. Englisch.…

Taschenbuch. Condizione: Neu. This item is printed on demand - Print on Demand Titel. Neuware -This book introduces a novel framework for accurately modeling the errors in nanoscale CMOS technology and developing a smooth tool flow at high-level design abstractions to estimate and mitigate the effects of errors. The book presents novel techniques for high-level fault simulation and reliability estimation as well as architecture-level and system-level fault tolerant designs. It also presents a survey of state-of-the-art problems and solutions, offering insights into reliability issues in digital design and their cross-layer countermeasures.Springer-Verlag KG, Sachsenplatz 4-6, 1201 Wien 220 pp. Englisch.…

Condizione: New. Print on Demand pp. 217.

Condizione: New. PRINT ON DEMAND pp. 217.