ISBN: 9789811567193 - principles of extreme mechanics (xm) in design for reliability (dfr) for advanced and emerging micro/nanoscale devices and systems: with special ... and experimentation techniques (11 risultati)

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Buch. Condizione: Neu. Druck auf Anfrage Neuware - Printed after ordering - This book addresses issues pertinent to mechanics and stress generation, especially in recentadvanced cases of technology developments, spanning from micrometer interconnects in solar photovoltaics (PV), next-gen energy storage devices to multilayers of nano-scale composites enabling novel stretchable/flexible conductor technologies. In these cases, the mechanics of materials have been pushed to the extreme edges of human knowledge to enable cutting-edge, unprecedented functionalities and technological innovations. Synchrotron X-ray diffraction, in situ small-scale mechanical testing combined with physics-based computational modeling/simulation, has been widely used approaches to probe these mechanics of the materials at their extreme limits due to their recently discovered distinct advantages. The techniques discussed in this manuscript are highlights specially curated from the broad body of work recently reported in the literature, especially ones that the author had led thepursuits at the frontier himself. Extreme stress generation in these advanced material leads to often new failure modes, and hence, the reliability of the final product is directly affected. From the recent topics and various advanced case studies covered in this book, the reader gets an updated knowledge of how new mechanics can and has been applied in Design-for-Reliability (DfR) for some of the latest technological innovations known in our modern world. Further, this also helps in building better designs, which may avoid the pitfalls of the current practiced trends.…

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Hardcover. Condizione: Brand New. 258 pages. 9.25x6.10x0.79 inches. In Stock.

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Gebunden. Condizione: New. Dieser Artikel ist ein Print on Demand Artikel und wird nach Ihrer Bestellung fuer Sie gedruckt. Presents the relation of mechanics in nanodevices and its effect on the performance reliability&nbspIntroduces a new and non-destructive method of probing stress which not many books would have addressed till date&nbsp.…

Buch. Condizione: Neu. This item is printed on demand - it takes 3-4 days longer - Neuware -This book addresses issues pertinent to mechanics and stress generation, especially in recentadvanced cases of technology developments, spanning from micrometer interconnects in solar photovoltaics (PV), next-gen energy storage devices to multilayers of nano-scale composites enabling novel stretchable/flexible conductor technologies. In these cases, the mechanics of materials have been pushed to the extreme edges of human knowledge to enable cutting-edge, unprecedented functionalities and technological innovations. Synchrotron X-ray diffraction, in situ small-scale mechanical testing combined with physics-based computational modeling/simulation, has been widely used approaches to probe these mechanics of the materials at their extreme limits due to their recently discovered distinct advantages. The techniques discussed in this manuscript are highlights specially curated from the broad body of work recently reported in the literature, especially ones that the author had led thepursuits at the frontier himself. Extreme stress generation in these advanced material leads to often new failure modes, and hence, the reliability of the final product is directly affected. From the recent topics and various advanced case studies covered in this book, the reader gets an updated knowledge of how new mechanics can and has been applied in Design-for-Reliability (DfR) for some of the latest technological innovations known in our modern world. Further, this also helps in building better designs, which may avoid the pitfalls of the current practiced trends. 260 pp. Englisch. …

Buch. Condizione: Neu. This item is printed on demand - Print on Demand Titel. Neuware -This book addresses issues pertinent to mechanics and stress generation, especially in recent advanced cases of technology developments, spanning from micrometer interconnects in solar photovoltaics (PV), next-gen energy storage devices to multilayers of nano-scale composites enabling novel stretchable/flexible conductor technologies. In these cases, the mechanics of materials have been pushed to the extreme edges of human knowledge to enable cutting-edge, unprecedented functionalities and technological innovations. Synchrotron X-ray diffraction, in situ small-scale mechanical testing combined with physics-based computational modeling/simulation, has been widely used approaches to probe these mechanics of the materials at their extreme limits due to their recently discovered distinct advantages. The techniques discussed in this manuscript are highlights specially curated from the broad body of work recently reported in the literature, especially ones that the author had led thepursuits at the frontier himself. Extreme stress generation in these advanced material leads to often new failure modes, and hence, the reliability of the final product is directly affected. From the recent topics and various advanced case studies covered in this book, the reader gets an updated knowledge of how new mechanics can and has been applied in Design-for-Reliability (DfR) for some of the latest technological innovations known in our modern world. Further, this also helps in building better designs, which may avoid the pitfalls of the current practiced trends.Springer Verlag GmbH, Tiergartenstr. 17, 69121 Heidelberg 260 pp. Englisch. …

Condizione: New. Print on Demand.

Condizione: New. PRINT ON DEMAND.