9789811931314 - thermal reliability of power semiconductor device in the renewable energy system di du, xiong; zhang, jun; li, gaoxian; yu, yaoyi; qian, cheng (9 risultati)
Thermal Reliability of Power Semiconductor Device in the Renewable Energy System (Cpss Power Electronics Series) [Hardcover] [Jul 09, 2022] Du, Xiong; Zhang, Jun; Li, Gaoxian; Yu, Yaoyi; Qian, Cheng and Du, Rui
Du, Xiong; Zhang, Jun; Li, Gaoxian; Yu, Yaoyi; Qian, Cheng; Du, Rui
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Da: StainesBookhub, Weybridge, SURRE, Regno UnitoStainesBookhub
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Condizione: New. A brand new book in pristine condition. Showing zero signs of shelf wear, creases, or damage.
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Da: Grand Eagle Retail, Bensenville, IL, U.S.A.Grand Eagle Retail
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Hardcover. Condizione: new. Hardcover. This book focuses on the thermal reliability of power semiconductor device by looking at the failure mechanism, thermal parameters monitoring, junction temperature estimation, lifetime evaluation, and thermal management. Theoretical analysis and experimental tests are presented to explain e…xisting reliability improvement techniques. This book is a valuable reference for the students and researchers who pay attention to the thermal reliability design of power semiconductor device. This book focuses on the thermal reliability of power semiconductor device by looking at the failure mechanism, thermal parameters monitoring, junction temperature estimation, lifetime evaluation, and thermal management. Shipping may be from multiple locations in the US or from the UK, depending on stock availability.
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Da: AHA-BUCH GmbH, Einbeck, GermaniaAHA-BUCH GmbH
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Buch. Condizione: Neu. Druck auf Anfrage Neuware - Printed after ordering - This book focuses on the thermal reliability of power semiconductor device by looking at the failure mechanism, thermal parameters monitoring, junction temperature estimation, lifetime evaluation, and thermal management. Theoretical analysis and experime…ntal tests are presented to explain existing reliability improvement techniques. This book is a valuable reference for the students and researchers who pay attention to the thermal reliability design of power semiconductor device.
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Da: Revaluation Books, Exeter, Regno UnitoRevaluation Books
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Hardcover. Condizione: Brand New. 188 pages. 9.25x6.10x0.63 inches. In Stock.
Thermal Reliability of Power Semiconductor Device in the Renewable Energy System Xiong Du, Jun Zhang, Rui Du, Yaoyi Yu, Cheng Qian, Gaoxian Li
Xiong Du, Jun Zhang, Rui Du, Yaoyi Yu, Cheng Qian, Gaoxian Li
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Da: BUCHSERVICE / ANTIQUARIAT Lars Lutzer, Wahlstedt, GermaniaBUCHSERVICE / ANTIQUARIAT Lars Lutzer
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EUR 229,90
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Hardcover. Condizione: gut. 2022. Thermal Reliability of Power Semiconductor Device in the Renewable Energy System In deutscher Sprache. pages.
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Da: Brook Bookstore On Demand, Napoli, NA, ItaliaBrook Bookstore On Demand
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Condizione: new. Questo è un articolo print on demand.
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Da: BuchWeltWeit Ludwig Meier e.K., Bergisch Gladbach, GermaniaBuchWeltWeit Ludwig Meier e.K.
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Buch. Condizione: Neu. This item is printed on demand - it takes 3-4 days longer - Neuware -This book focuses on the thermal reliability of power semiconductor device by looking at the failure mechanism, thermal parameters monitoring, junction temperature estimation, lifetime evaluation, and thermal management. Theoretical analy…sis and experimental tests are presented to explain existing reliability improvement techniques. This book is a valuable reference for the students and researchers who pay attention to the thermal reliability design of power semiconductor device. 188 pp. Englisch.
Thermal Reliability of Power Semiconductor Device in the Renewable Energy System
Du, Xiong|Zhang, Jun|Li, Gaoxian|Yu, Yaoyi|Qian, Cheng|Du, Rui
Lingua: Inglese
Editore: Springer, Berlin|Springer Nature Singapore|Springer, 2022
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Da: moluna, Greven, Germaniamoluna
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EUR 136,16
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Gebunden. Condizione: New. Dieser Artikel ist ein Print on Demand Artikel und wird nach Ihrer Bestellung fuer Sie gedruckt. This book focuses on the thermal reliability of power semiconductor device by looking at the failure mechanism, thermal parameters monitoring, junction temperature estimation, lifetime evaluation, and therm…al management. Theoretical analysis and experimenta.
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Da: buchversandmimpf2000, Emtmannsberg, BAYE, Germaniabuchversandmimpf2000
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EUR 160,49
EUR 60,00 spedizioneSpedito da Germania a U.S.A.Quantità: 1 disponibili
Buch. Condizione: Neu. This item is printed on demand - Print on Demand Titel. Neuware -This book focuses on the thermal reliability of power semiconductor device by looking at the failure mechanism, thermal parameters monitoring, junction temperature estimation, lifetime evaluation, and thermal management. Theoretical analysis…and experimental tests are presented to explain existing reliability improvement techniques. This book is a valuable reference for the students and researchers who pay attention to the thermal reliability design of power semiconductor device.Springer-Verlag GmbH, Tiergartenstr. 17, 69121 Heidelberg 188 pp. Englisch.
