Da: Basi6 International, Irving, TX, U.S.A.
Condizione: Brand New. New. US edition. Expediting shipping for all USA and Europe orders excluding PO Box. Excellent Customer Service.
EUR 129,24
Quantità: 5 disponibili
Aggiungi al carrelloHardcover. Condizione: New.
Da: GreatBookPricesUK, Woodford Green, Regno Unito
EUR 132,17
Quantità: 10 disponibili
Aggiungi al carrelloCondizione: New.
Condizione: New.
Condizione: New. pp. 350 1st Edition.
Da: GreatBookPricesUK, Woodford Green, Regno Unito
EUR 156,14
Quantità: 10 disponibili
Aggiungi al carrelloCondizione: As New. Unread book in perfect condition.
EUR 146,68
Quantità: 1 disponibili
Aggiungi al carrelloHardcover. Condizione: Like New. LIKE NEW. SHIPS FROM MULTIPLE LOCATIONS. book.
EUR 164,02
Quantità: 3 disponibili
Aggiungi al carrelloCondizione: New. pp. 350.
Condizione: As New. Unread book in perfect condition.
EUR 141,94
Quantità: Più di 20 disponibili
Aggiungi al carrelloCondizione: New. Oliver H. Seeck graduated from the University of Kiel (Germany), studying the structure of thin layers and surfaces. He continued this research as post-doc at the Advanced Photon Source in Chicago. Thereafter, he worked as a scientist at.
Lingua: Inglese
Editore: TAYLOR & FRANCIS EXCLUSIVE(CBS), 2015
ISBN 10: 9814303593 ISBN 13: 9789814303590
Da: UK BOOKS STORE, London, LONDO, Regno Unito
EUR 204,51
Quantità: 2 disponibili
Aggiungi al carrelloCondizione: New. Brand New! Fast Delivery This is an International Edition and ship within 24-48 hours. Deliver by FedEx and Dhl, & Aramex, UPS, & USPS and we do accept APO and PO BOX Addresses. Order can be delivered worldwide within 7-12 days and we do have flat rate for up to 2LB. Extra shipping charges will be requested if the Book weight is more than 5 LB. This Item May be shipped from India, United states & United Kingdom. Depending on your location and availability.
Lingua: Inglese
Editore: Jenny Stanford Publishing Feb 2015, 2015
ISBN 10: 9814303593 ISBN 13: 9789814303590
Da: AHA-BUCH GmbH, Einbeck, Germania
EUR 175,23
Quantità: 2 disponibili
Aggiungi al carrelloBuch. Condizione: Neu. Neuware - High-resolution x-ray diffraction and scattering is a key tool for structure analysis not only in bulk materials but also at surfaces and buried interfaces from the sub-nanometer range to micrometers. This book offers an overview of diffraction and scattering methods currently available at modern synchrotron sources and illustrates bulk and interface investigations of solid and liquid matter with up-to-date research examples. It presents important characteristics of the sources, experimental set-up, and new detector developments. The book also considers future exploitation of x-ray free electron lasers for diffraction applications.
Da: Majestic Books, Hounslow, Regno Unito
EUR 146,30
Quantità: 3 disponibili
Aggiungi al carrelloCondizione: New. pp. 350 This item is printed on demand.