Advances scanning probe microscopy (25 risultati)

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  • Lingua: Inglese

    Editore: Springer, Berlin, 2000

    3540667180 / 9783540667186

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    XIV, 341 S. mit zahlreichen Abbildungen, 3540667180 Sprache: Englisch Gewicht in Gramm: 600 Groß 8°, Original-Pappband (Hardcover), Bibliotheks-Exemplar (ordungsgemäß entwidmet), leichte Rückstände vom Rückenschild, Stempel verso Titel, insgesamt gutes und innen sauberes Exemplar.

  • Lingua: Inglese

    Editore: Springer, 2012

    3642630847 / 9783642630842

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    Da: California Books, Miami, FL, U.S.A.California Books

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  • Lingua: Inglese

    Editore: Springer, 2012

    3642630847 / 9783642630842

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    Condizione: New. In English.

  • Lingua: Inglese

    Editore: Springer, 2000

    3540667180 / 9783540667186

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    Condizione: New. In English.

  • Lingua: Inglese

    Editore: Springer, 2012

    3642630847 / 9783642630842

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    Condizione: New. pp. 362.

  • Lingua: Inglese

    Editore: Springer, 2000

    3540667180 / 9783540667186

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    Condizione: New. pp. 362.

  • Lingua: Inglese

    Editore: Springer, 2000

    3540667180 / 9783540667186

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    Da: Mispah books, Redhill, SURRE, Regno UnitoMispah books

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    Hardcover. Condizione: Like New. LIKE NEW. SHIPS FROM MULTIPLE LOCATIONS. book.

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    Lingua: Inglese

    Editore: Springer, 2012

    3642630847 / 9783642630842

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    Taschenbuch. Condizione: Neu. Advances in Scanning Probe Microscopy | T. Sakurai (u. a.) | Taschenbuch | Advances in Materials Research | xiv | Englisch | 2012 | Springer | EAN 9783642630842 | Verantwortliche Person für die EU: Springer Verlag GmbH, Tiergartenstr. 17, 69121 Heidelberg, juergen[dot]hartmann[at]springer[dot]com | Anbieter: preigu.

  • Lingua: Inglese

    Editore: Springer Verlag, 2000

    3540667180 / 9783540667186

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    Da: Revaluation Books, Exeter, Regno UnitoRevaluation Books

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    Hardcover. Condizione: Brand New. 1st edition. 341 pages. 9.75x6.50x0.75 inches. In Stock.

  • Lingua: Inglese

    Editore: Springer Berlin Heidelberg, Springer Berlin Heidelberg, 2000

    3540667180 / 9783540667186

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    Da: AHA-BUCH GmbH, Einbeck, GermaniaAHA-BUCH GmbH

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    Buch. Condizione: Neu. Druck auf Anfrage Neuware - Printed after ordering - There have been many books published on scanning tunneling microscopy (STM), atomic force microscopy (AFM) and related subjects since Dr. Cerd Binnig and Dr. Heinrich Rohrer invented STM in 1982 and AFM in 1986 at IBM Research Center in Zurich, Switzerland. These two techniques, STM and AFM, now form the core of what has come to be called the 'scanning probe microscopy (SPM)' family. SPM is not just the most powerful microscope for scientists to image atoms on surfaces, but is also becoming an indispensable tool for manipulating atoms and molecules to construct man-made materials and devices. Its impact has been felt in various fields, from surface physics and chemistry to nano-mechanics, nano-electronics and medical science. Its influence will surely extend further as the years go by, beyond the reach of our present imagination, and new research applications will continue to emerge. This book, therefore, is not intended to be a comprehensive review or textbook on SPM. Its aim is to cover only a selected part of the active re search fields of SPM and related topics in which I have been directly involved over the years. These include the basic principles of STM and AFM, and their applications to fullerene film growth, SiC surface reconstructions, MBE (molecular beam epitaxy) growth of CaAs, atomic scale manipulation of Si surfaces and meso scopic work function.

  • Lingua: Inglese

    Editore: Springer, 2012

    3642630847 / 9783642630842

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    Da: AHA-BUCH GmbH, Einbeck, GermaniaAHA-BUCH GmbH

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    Taschenbuch. Condizione: Neu. Druck auf Anfrage Neuware - Printed after ordering - There have been many books published on scanning tunneling microscopy (STM), atomic force microscopy (AFM) and related subjects since Dr. Cerd Binnig and Dr. Heinrich Rohrer invented STM in 1982 and AFM in 1986 at IBM Research Center in Zurich, Switzerland. These two techniques, STM and AFM, now form the core of what has come to be called the 'scanning probe microscopy (SPM)' family. SPM is not just the most powerful microscope for scientists to image atoms on surfaces, but is also becoming an indispensable tool for manipulating atoms and molecules to construct man-made materials and devices. Its impact has been felt in various fields, from surface physics and chemistry to nano-mechanics, nano-electronics and medical science. Its influence will surely extend further as the years go by, beyond the reach of our present imagination, and new research applications will continue to emerge. This book, therefore, is not intended to be a comprehensive review or textbook on SPM. Its aim is to cover only a selected part of the active re search fields of SPM and related topics in which I have been directly involved over the years. These include the basic principles of STM and AFM, and their applications to fullerene film growth, SiC surface reconstructions, MBE (molecular beam epitaxy) growth of CaAs, atomic scale manipulation of Si surfaces and meso scopic work function.

  • Lingua: Inglese

    Editore: Springer, 2012

    3642630847 / 9783642630842

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    Da: Mispah books, Redhill, SURRE, Regno UnitoMispah books

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    Paperback. Condizione: Like New. LIKE NEW. SHIPS FROM MULTIPLE LOCATIONS. book.

  • Lingua: Inglese

    Editore: Springer, 2000

    3540667180 / 9783540667186

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    Da: BUCHSERVICE / ANTIQUARIAT Lars Lutzer, Wahlstedt, GermaniaBUCHSERVICE / ANTIQUARIAT Lars Lutzer

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    Condizione: gut. Advances in scanning probe microscopy. (= Springer series in advances in materials research - Volume 2). In deutscher Sprache. pages.

  • Lingua: Inglese

    Editore: Springer, 2012

    3642630847 / 9783642630842

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    Da: Brook Bookstore On Demand, Napoli, NA, ItaliaBrook Bookstore On Demand

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    Condizione: new. Questo è un articolo print on demand.

  • Lingua: Inglese

    Editore: Springer Berlin Heidelberg Okt 2012, 2012

    3642630847 / 9783642630842

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    Da: BuchWeltWeit Ludwig Meier e.K., Bergisch Gladbach, GermaniaBuchWeltWeit Ludwig Meier e.K.

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    Taschenbuch. Condizione: Neu. This item is printed on demand - it takes 3-4 days longer - Neuware -There have been many books published on scanning tunneling microscopy (STM), atomic force microscopy (AFM) and related subjects since Dr. Cerd Binnig and Dr. Heinrich Rohrer invented STM in 1982 and AFM in 1986 at IBM Research Center in Zurich, Switzerland. These two techniques, STM and AFM, now form the core of what has come to be called the 'scanning probe microscopy (SPM)' family. SPM is not just the most powerful microscope for scientists to image atoms on surfaces, but is also becoming an indispensable tool for manipulating atoms and molecules to construct man-made materials and devices. Its impact has been felt in various fields, from surface physics and chemistry to nano-mechanics, nano-electronics and medical science. Its influence will surely extend further as the years go by, beyond the reach of our present imagination, and new research applications will continue to emerge. This book, therefore, is not intended to be a comprehensive review or textbook on SPM. Its aim is to cover only a selected part of the active re search fields of SPM and related topics in which I have been directly involved over the years. These include the basic principles of STM and AFM, and their applications to fullerene film growth, SiC surface reconstructions, MBE (molecular beam epitaxy) growth of CaAs, atomic scale manipulation of Si surfaces and meso scopic work function. 360 pp. Englisch.

  • Lingua: Inglese

    Editore: Springer Berlin Heidelberg Mrz 2000, 2000

    3540667180 / 9783540667186

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    Da: BuchWeltWeit Ludwig Meier e.K., Bergisch Gladbach, GermaniaBuchWeltWeit Ludwig Meier e.K.

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    Buch. Condizione: Neu. This item is printed on demand - it takes 3-4 days longer - Neuware -There have been many books published on scanning tunneling microscopy (STM), atomic force microscopy (AFM) and related subjects since Dr. Cerd Binnig and Dr. Heinrich Rohrer invented STM in 1982 and AFM in 1986 at IBM Research Center in Zurich, Switzerland. These two techniques, STM and AFM, now form the core of what has come to be called the 'scanning probe microscopy (SPM)' family. SPM is not just the most powerful microscope for scientists to image atoms on surfaces, but is also becoming an indispensable tool for manipulating atoms and molecules to construct man-made materials and devices. Its impact has been felt in various fields, from surface physics and chemistry to nano-mechanics, nano-electronics and medical science. Its influence will surely extend further as the years go by, beyond the reach of our present imagination, and new research applications will continue to emerge. This book, therefore, is not intended to be a comprehensive review or textbook on SPM. Its aim is to cover only a selected part of the active re search fields of SPM and related topics in which I have been directly involved over the years. These include the basic principles of STM and AFM, and their applications to fullerene film growth, SiC surface reconstructions, MBE (molecular beam epitaxy) growth of CaAs, atomic scale manipulation of Si surfaces and meso scopic work function. 360 pp. Englisch.

  • Lingua: Inglese

    Editore: Springer Berlin Heidelberg, 2012

    3642630847 / 9783642630842

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    Condizione: New. Dieser Artikel ist ein Print on Demand Artikel und wird nach Ihrer Bestellung fuer Sie gedruckt. Provides introduction to selected theoretical and experimental aspects of particular current interest in this rapidly developing fieldOf interest to newcomers and established workers alikeThere have been many books published on scanning tunneling mi.

  • Lingua: Inglese

    Editore: Springer Berlin Heidelberg, 2000

    3540667180 / 9783540667186

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    Condizione: New. Dieser Artikel ist ein Print on Demand Artikel und wird nach Ihrer Bestellung fuer Sie gedruckt. Provides introduction to selected theoretical and experimental aspects of particular current interest in this rapidly developing fieldOf interest to newcomers and established workers alikeThere have been many books published on scanning tunneling mi.

  • Lingua: Inglese

    Editore: Springer, 2012

    3642630847 / 9783642630842

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    Condizione: New. Print on Demand pp. 362 49:B&W 6.14 x 9.21 in or 234 x 156 mm (Royal 8vo) Perfect Bound on White w/Gloss Lam.

  • Lingua: Inglese

    Editore: Springer, 2000

    3540667180 / 9783540667186

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    Condizione: New. Print on Demand pp. 362 171 Illus.

  • Lingua: Inglese

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    3540667180 / 9783540667186

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    Condizione: New. PRINT ON DEMAND pp. 362.

  • Lingua: Inglese

    Editore: Springer, 2012

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    Condizione: New. PRINT ON DEMAND pp. 362.

  • Lingua: Inglese

    Editore: Springer-Verlag GmbH, 2000

    3540667180 / 9783540667186

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    Buch. Condizione: Neu. Advances in Scanning Probe Microscopy | Y. Watanabe (u. a.) | Buch | xiv | Englisch | 2000 | Springer-Verlag GmbH | EAN 9783540667186 | Verantwortliche Person für die EU: Springer Verlag GmbH, Tiergartenstr. 17, 69121 Heidelberg, juergen[dot]hartmann[at]springer[dot]com | Anbieter: preigu Print on Demand.

  • Lingua: Inglese

    Editore: Springer Berlin Heidelberg, Springer Berlin Heidelberg Mär 2000, 2000

    3540667180 / 9783540667186

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    Da: buchversandmimpf2000, Emtmannsberg, BAYE, Germaniabuchversandmimpf2000

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    Buch. Condizione: Neu. This item is printed on demand - Print on Demand Titel. Neuware -There have been many books published on scanning tunneling microscopy (STM), atomic force microscopy (AFM) and related subjects since Dr. Cerd Binnig and Dr. Heinrich Rohrer invented STM in 1982 and AFM in 1986 at IBM Research Center in Zurich, Switzerland. These two techniques, STM and AFM, now form the core of what has come to be called the 'scanning probe microscopy (SPM)' family. SPM is not just the most powerful microscope for scientists to image atoms on surfaces, but is also becoming an indispensable tool for manipulating atoms and molecules to construct man-made materials and devices. Its impact has been felt in various fields, from surface physics and chemistry to nano-mechanics, nano-electronics and medical science. Its influence will surely extend further as the years go by, beyond the reach of our present imagination, and new research applications will continue to emerge. This book, therefore, is not intended to be a comprehensive review or textbook on SPM. Its aim is to cover only a selected part of the active re search fields of SPM and related topics in which I have been directly involved over the years. These include the basic principles of STM and AFM, and their applications to fullerene film growth, SiC surface reconstructions, MBE (molecular beam epitaxy) growth of CaAs, atomic scale manipulation of Si surfaces and meso scopic work function.Springer Verlag GmbH, Tiergartenstr. 17, 69121 Heidelberg 360 pp. Englisch.

  • Lingua: Inglese

    Editore: Springer, Springer Okt 2012, 2012

    3642630847 / 9783642630842

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    Da: buchversandmimpf2000, Emtmannsberg, BAYE, Germaniabuchversandmimpf2000

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    Taschenbuch. Condizione: Neu. This item is printed on demand - Print on Demand Titel. Neuware -This book will be of interest to all those involved in using scanning probe microscopy and will help point the way towards new applications. Of particular interest is the manipulation of single atoms for producing future single-electron devices.Springer-Verlag KG, Sachsenplatz 4-6, 1201 Wien 360 pp. Englisch.