Da: Chiron Media, Wallingford, Regno Unito
EUR 105,07
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EUR 120,57
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Aggiungi al carrelloCondizione: New. pp. 256 14:B&W 6 x 9 in or 229 x 152 mm Case Laminate on White w/Gloss Lam.
EUR 129,94
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Aggiungi al carrelloCondizione: New. pp. 256.
EUR 119,13
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Aggiungi al carrelloHardcover. Condizione: Brand New. 1st edition. 252 pages. 9.25x6.25x1.00 inches. In Stock.
EUR 135,28
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Editore: Elsevier Science Publishing Co Inc, 2013
ISBN 10: 0124095011 ISBN 13: 9780124095014
Lingua: Inglese
Da: THE SAINT BOOKSTORE, Southport, Regno Unito
EUR 130,35
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Aggiungi al carrelloHardback. Condizione: New. New copy - Usually dispatched within 4 working days. 552.
EUR 135,78
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Da: GreatBookPricesUK, Woodford Green, Regno Unito
EUR 135,63
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EUR 161,44
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Aggiungi al carrelloCondizione: As New. Unread book in perfect condition.
Da: Ria Christie Collections, Uxbridge, Regno Unito
EUR 148,22
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Da: GreatBookPricesUK, Woodford Green, Regno Unito
EUR 162,40
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Editore: Elsevier Science Publishing Co Inc, US, 2013
ISBN 10: 0124095011 ISBN 13: 9780124095014
Lingua: Inglese
Da: Rarewaves.com USA, London, LONDO, Regno Unito
EUR 214,27
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Aggiungi al carrelloHardback. Condizione: New. This book addresses one of the key problems in signal processing, the problem of identifying statistical properties of excursions in a random process in order to simplify the theoretical analysis and make it suitable for engineering applications. Precise and approximate formulas are explained, which are relatively simple and can be used for engineering applications such as the design of devices which can overcome the high initial uncertainty of the self-training period. The information presented in the monograph can be used to implement adaptive signal processing devices capable of detecting or recognizing the wanted signals (with a priori unknown statistical properties) against the background noise. The applications presented can be used in a wide range of fields including medicine, radiolocation, telecommunications, surface quality control (flaw detection), image recognition, thermal noise analysis for the design of semiconductors, and calculation of excessive load in mechanics.
Editore: Elsevier Science & Technology|Elsevier, 2013
ISBN 10: 0124095011 ISBN 13: 9780124095014
Lingua: Inglese
Da: moluna, Greven, Germania
EUR 160,98
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Aggiungi al carrelloGebunden. Condizione: New. Addresses one of the key problems in signal processing, the problem of identifying statistical properties of excursions in a random process in order to simplify the theoretical analysis and make it suitable for engineering applications. This book supplies a.
Editore: Elsevier Science Publishing Co Inc, US, 2013
ISBN 10: 0124095011 ISBN 13: 9780124095014
Lingua: Inglese
Da: Rarewaves.com UK, London, Regno Unito
EUR 199,01
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Aggiungi al carrelloHardback. Condizione: New. This book addresses one of the key problems in signal processing, the problem of identifying statistical properties of excursions in a random process in order to simplify the theoretical analysis and make it suitable for engineering applications. Precise and approximate formulas are explained, which are relatively simple and can be used for engineering applications such as the design of devices which can overcome the high initial uncertainty of the self-training period. The information presented in the monograph can be used to implement adaptive signal processing devices capable of detecting or recognizing the wanted signals (with a priori unknown statistical properties) against the background noise. The applications presented can be used in a wide range of fields including medicine, radiolocation, telecommunications, surface quality control (flaw detection), image recognition, thermal noise analysis for the design of semiconductors, and calculation of excessive load in mechanics.
Da: Brook Bookstore On Demand, Napoli, NA, Italia
EUR 106,96
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Aggiungi al carrelloCondizione: new. Questo è un articolo print on demand.
Editore: Elsevier Science & Technology, Elsevier, 2013
ISBN 10: 0124095011 ISBN 13: 9780124095014
Lingua: Inglese
Da: BuchWeltWeit Ludwig Meier e.K., Bergisch Gladbach, Germania
EUR 118,00
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Aggiungi al carrelloBuch. Condizione: Neu. This item is printed on demand - it takes 3-4 days longer - Neuware -This book addresses one of the key problems in signal processing, the problem of identifying statistical properties of excursions in a random process in order to simplify the theoretical analysis and make it suitable for engineering applications. Precise and approximate formulas are explained, which are relatively simple and can be used for engineering applications such as the design of devices which can overcome the high initial uncertainty of the self-training period. The information presented in the monograph can be used to implement adaptive signal processing devices capable of detecting or recognizing the wanted signals (with a priori unknown statistical properties) against the background noise. The applications presented can be used in a wide range of fields including medicine, radiolocation, telecommunications, surface quality control (flaw detection), image recognition, thermal noise analysis for the design of semiconductors, and calculation of excessive load in mechanics. Englisch.
Editore: Elsevier Science Publishing Co Inc, 2013
ISBN 10: 0124095011 ISBN 13: 9780124095014
Lingua: Inglese
Da: THE SAINT BOOKSTORE, Southport, Regno Unito
EUR 173,63
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Aggiungi al carrelloHardback. Condizione: New. This item is printed on demand. New copy - Usually dispatched within 5-9 working days 552.
Editore: Elsevier Science & Technology, Elsevier, 2013
ISBN 10: 0124095011 ISBN 13: 9780124095014
Lingua: Inglese
Da: AHA-BUCH GmbH, Einbeck, Germania
EUR 131,78
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Aggiungi al carrelloBuch. Condizione: Neu. nach der Bestellung gedruckt Neuware - Printed after ordering - This book addresses one of the key problems in signal processing, the problem of identifying statistical properties of excursions in a random process in order to simplify the theoretical analysis and make it suitable for engineering applications. Precise and approximate formulas are explained, which are relatively simple and can be used for engineering applications such as the design of devices which can overcome the high initial uncertainty of the self-training period. The information presented in the monograph can be used to implement adaptive signal processing devices capable of detecting or recognizing the wanted signals (with a priori unknown statistical properties) against the background noise. The applications presented can be used in a wide range of fields including medicine, radiolocation, telecommunications, surface quality control (flaw detection), image recognition, thermal noise analysis for the design of semiconductors, and calculation of excessive load in mechanics.