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EUR 58,56
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EUR 58,55
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EUR 77,40
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EUR 76,21
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EUR 66,41
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EUR 85,81
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EUR 85,23
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EUR 76,38
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Da: Kennys Bookshop and Art Galleries Ltd., Galway, GY, Irlanda
Prima edizione
EUR 79,12
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Aggiungi al carrelloCondizione: New. 2020. 1st ed. 2021. hardcover. . . . . .
EUR 78,72
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EUR 86,18
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Condizione: New. 2020. 1st ed. 2021. hardcover. . . . . . Books ship from the US and Ireland.
EUR 91,91
Quantità: 2 disponibili
Aggiungi al carrelloHardcover. Condizione: Brand New. 621 pages. 9.25x6.10x1.61 inches. In Stock.
Lingua: Inglese
Editore: Springer International Publishing, Springer International Publishing Dez 2020, 2020
ISBN 10: 3030520161 ISBN 13: 9783030520168
Da: buchversandmimpf2000, Emtmannsberg, BAYE, Germania
EUR 53,49
Quantità: 2 disponibili
Aggiungi al carrelloBuch. Condizione: Neu. Neuware -This Open Access book introduces readers to many new techniques for enhancing and optimizing reliability in embedded systems, which have emerged particularly within the last five years. This book introduces the most prominent reliability concerns from today¿s points of view and roughly recapitulates the progress in the community so far. Unlike other books that focus on a single abstraction level such circuit level or system level alone, the focus of this book is to deal with the different reliability challenges across different levels starting from the physical level all the way to the system level (cross-layer approaches). The book aims at demonstrating how new hardware/software co-design solution can be proposed to ef-fectively mitigate reliability degradation such as transistor aging, processor variation, temperature effects, soft errors, etc.Provides readers with latest insights into novel, cross-layer methods and models with respect to dependability of embedded systems;Describes cross-layer approaches that can leverage reliability through techniques that are pro-actively designed with respect to techniques at other layers;Explains run-time adaptation and concepts/means of self-organization, in order to achieve error resiliency in complex, future many core systems.Springer Verlag GmbH, Tiergartenstr. 17, 69121 Heidelberg 624 pp. Englisch.
Lingua: Inglese
Editore: Springer International Publishing, 2020
ISBN 10: 3030520161 ISBN 13: 9783030520168
Da: AHA-BUCH GmbH, Einbeck, Germania
EUR 53,49
Quantità: 1 disponibili
Aggiungi al carrelloBuch. Condizione: Neu. Druck auf Anfrage Neuware - Printed after ordering - This Open Access book introduces readers to many new techniques for enhancing and optimizing reliability in embedded systems, which have emerged particularly within the last five years. This book introduces the most prominent reliability concerns from today's points of view and roughly recapitulates the progress in the community so far. Unlike other books that focus on a single abstraction level such circuit level or system level alone, the focus of this book is to deal with the different reliability challenges across different levels starting from the physical level all the way to the system level (cross-layer approaches). The book aims at demonstrating how new hardware/software co-design solution can be proposed to ef-fectively mitigate reliability degradation such as transistor aging, processor variation, temperature effects, soft errors, etc.Provides readers with latest insights into novel, cross-layer methods and models with respect to dependability of embedded systems;Describes cross-layer approaches that can leverage reliability through techniques that are pro-actively designed with respect to techniques at other layers;Explains run-time adaptation and concepts/means of self-organization, in order to achieve error resiliency in complex, future many core systems.
EUR 99,78
Quantità: 1 disponibili
Aggiungi al carrelloHardcover. Condizione: New. New. book.
Condizione: New.
EUR 88,44
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Aggiungi al carrelloCondizione: New.
Lingua: Inglese
Editore: Springer International Publishing, 2020
ISBN 10: 3030520161 ISBN 13: 9783030520168
Da: Buchpark, Trebbin, Germania
EUR 33,29
Quantità: 1 disponibili
Aggiungi al carrelloCondizione: Hervorragend. Zustand: Hervorragend | Seiten: 624 | Sprache: Englisch | Produktart: Bücher | This Open Access book introduces readers to many new techniques for enhancing and optimizing reliability in embedded systems, which have emerged particularly within the last five years. This book introduces the most prominent reliability concerns from today¿s points of view and roughly recapitulates the progress in the community so far. Unlike other books that focus on a single abstraction level such circuit level or system level alone, the focus of this book is to deal with the different reliability challenges across different levels starting from the physical level all the way to the system level (cross-layer approaches). The book aims at demonstrating how new hardware/software co-design solution can be proposed to ef-fectively mitigate reliability degradation such as transistor aging, processor variation, temperature effects, soft errors, etc.Provides readers with latest insights into novel, cross-layer methods and models with respect to dependability of embedded systems;Describes cross-layer approaches that can leverage reliability through techniques that are pro-actively designed with respect to techniques at other layers;Explains run-time adaptation and concepts/means of self-organization, in order to achieve error resiliency in complex, future many core systems.
Lingua: Inglese
Editore: Springer International Publishing Dez 2020, 2020
ISBN 10: 3030520161 ISBN 13: 9783030520168
Da: BuchWeltWeit Ludwig Meier e.K., Bergisch Gladbach, Germania
EUR 53,49
Quantità: 2 disponibili
Aggiungi al carrelloBuch. Condizione: Neu. This item is printed on demand - it takes 3-4 days longer - Neuware -This Open Access book introduces readers to many new techniques for enhancing and optimizing reliability in embedded systems, which have emerged particularly within the last five years. This book introduces the most prominent reliability concerns from today's points of view and roughly recapitulates the progress in the community so far. Unlike other books that focus on a single abstraction level such circuit level or system level alone, the focus of this book is to deal with the different reliability challenges across different levels starting from the physical level all the way to the system level (cross-layer approaches). The book aims at demonstrating how new hardware/software co-design solution can be proposed to ef-fectively mitigate reliability degradation such as transistor aging, processor variation, temperature effects, soft errors, etc.Provides readers with latest insights into novel, cross-layer methods and models with respect to dependability of embedded systems;Describes cross-layer approaches that can leverage reliability through techniques that are pro-actively designed with respect to techniques at other layers;Explains run-time adaptation and concepts/means of self-organization, in order to achieve error resiliency in complex, future many core systems. 624 pp. Englisch.
Da: Majestic Books, Hounslow, Regno Unito
EUR 72,63
Quantità: 4 disponibili
Aggiungi al carrelloCondizione: New. Print on Demand.
Da: Biblios, Frankfurt am main, HESSE, Germania
EUR 73,55
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Aggiungi al carrelloCondizione: New. PRINT ON DEMAND.
Lingua: Inglese
Editore: Springer International Publishing, 2020
ISBN 10: 3030520161 ISBN 13: 9783030520168
Da: moluna, Greven, Germania
EUR 48,37
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Aggiungi al carrelloGebunden. Condizione: New. Dieser Artikel ist ein Print on Demand Artikel und wird nach Ihrer Bestellung fuer Sie gedruckt. Provides readers with latest insights into novel, cross-layer methods and models with respect to dependability of embedded systemsDescribes cross-layer approaches that can leverage reliability through techniques that are pro-actively designed with.
Da: Majestic Books, Hounslow, Regno Unito
EUR 129,29
Quantità: 4 disponibili
Aggiungi al carrelloCondizione: New. Print on Demand.
Da: Biblios, Frankfurt am main, HESSE, Germania
EUR 129,98
Quantità: 4 disponibili
Aggiungi al carrelloCondizione: New. PRINT ON DEMAND.