Digital logic testing simulation (27 risultati)

Lingua: Inglese
Editore: Reading, MA, U.S.A.: Addison-Wesley Educational Publishers, Incorporated, 1985 1985
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Da: Bingo Used Books, Vancouver, WA, U.S.A.Bingo Used Books
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EUR 4,37
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Hardcover. Condizione: Very Good. Hardcover in very good + condition.

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Da: HPB-Red, Dallas, TX, U.S.A.HPB-Red
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EUR 13,20
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hardcover. Condizione: Good. Connecting readers with great books since 1972! Used textbooks may not include companion materials such as access codes, etc. May have some wear or writing/highlighting. We ship orders daily and Customer Service is our top priority.

Lingua: Inglese
Editore: Reading, MA, U.S.A. : Addison-Wesley Educational Publishers,. 1986
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Da: Virginia Martin, aka bookwitch, Concord, CA, U.S.A.Virginia Martin, aka bookwitch
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EUR 12,26
EUR 4,74 spedizioneSpedito in U.S.A.Quantità: 1 disponibili
Condizione: Very Good. Condizione sovraccoperta: Unknown. Octavo, hardcover, near fine in white pictorial boards. Clean and unmarked. 414 pp New algorithms are being devised to create tests for logic circuits, and more attention is being given to design for test techniques. In this comprehensive volume the state of the art in di…gital system design and testing is discussed. (as per 1985). Book.

- Brossura
Da: Anybook.com, Lincoln, Regno UnitoAnybook.com
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EUR 3,32
EUR 15,74 spedizioneSpedito da Regno Unito a U.S.A.Quantità: 1 disponibili
Condizione: Fair. This is an ex-library book and may have the usual library/used-book markings inside.This book has soft covers. In fair condition, suitable as a study copy. Please note the Image in this listing is a stock photo and may not match the covers of the actual item,650grams, ISBN:047161307X.

- Brossura
Da: Anybook.com, Lincoln, Regno UnitoAnybook.com
Contatta il venditoreVenditore con 5 stelleCondizione: Usato - Buono
EUR 4,21
EUR 15,74 spedizioneSpedito da Regno Unito a U.S.A.Quantità: 1 disponibili
Condizione: Good. This is an ex-library book and may have the usual library/used-book markings inside.This book has soft covers. Clean from markings. In good all round condition. Please note the Image in this listing is a stock photo and may not match the covers of the actual item,650grams, ISBN:047161307X.

- Rilegato
Da: Anybook.com, Lincoln, Regno UnitoAnybook.com
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EUR 22,89
EUR 15,74 spedizioneSpedito da Regno Unito a U.S.A.Quantità: 1 disponibili
Condizione: Fair. This is an ex-library book and may have the usual library/used-book markings inside.This book has hardback covers. Book contains pencil markings. In fair condition, suitable as a study copy. No dust jacket. Please note the Image in this listing is a stock photo and may not match the covers of the actual item,75…0grams, ISBN:0060444444.

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Da: Anybook.com, Lincoln, Regno UnitoAnybook.com
Contatta il venditoreVenditore con 5 stelleCondizione: Usato - Mediocre
EUR 22,89
EUR 15,74 spedizioneSpedito da Regno Unito a U.S.A.Quantità: 1 disponibili
Condizione: Poor. This is an ex-library book and may have the usual library/used-book markings inside.This book has hardback covers. In poor condition, suitable as a reading copy. No dust jacket. Water damaged. Please note the Image in this listing is a stock photo and may not match the covers of the actual item,750grams, ISBN:0…060444444.

Editore: Harper & Row, New York 1985
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- Prima edizione
Da: Between the Covers-Rare Books, Inc. ABAA, Gloucester City, NJ, U.S.A.Between the Covers-Rare Books, Inc. ABAA
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EUR 31,10
EUR 4,74 spedizioneSpedito in U.S.A.Quantità: 1 disponibili
Hardcover. Condizione: Fine. First edition. Near fine. Spine darkened just a little.

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Da: GoldBooks, Denver, CO, U.S.A.GoldBooks
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EUR 118,17
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Hardcover. Condizione: new. New Copy. Customer Service Guaranteed.

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Da: PBShop.store UK, Fairford, GLOS, Regno UnitoPBShop.store UK
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EUR 180,27
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HRD. Condizione: New. New Book. Shipped from UK. Established seller since 2000.

- Brossura
Da: Mispah books, Redhill, SURRE, Regno UnitoMispah books
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EUR 162,12
EUR 28,93 spedizioneSpedito da Regno Unito a U.S.A.Quantità: 1 disponibili
Paperback. Condizione: Acceptable. Acceptable. Dust Jacket NOT present. CD WILL BE MISSING. SHIPS FROM MULTIPLE LOCATIONS. book.

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Da: GreatBookPrices, Columbia, MD, U.S.A.GreatBookPrices
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EUR 192,91
EUR 2,28 spedizioneSpedito in U.S.A.Quantità: Più di 20 disponibili
Condizione: New.

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Da: Brook Bookstore On Demand, Napoli, NA, ItaliaBrook Bookstore On Demand
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EUR 179,48
EUR 11,00 spedizioneSpedito da Italia a U.S.A.Quantità: Più di 20 disponibili
Condizione: new.

- Rilegato
Da: GreatBookPricesUK, Woodford Green, Regno UnitoGreatBookPricesUK
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EUR 180,26
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Condizione: New.

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Da: Buchpark, Trebbin, , GermaniaBuchpark
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EUR 93,32
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Condizione: Gut. Zustand: Gut | Seiten: 696 | Sprache: Englisch | Produktart: Bücher | Your road map for meeting today's digital testing challenges Today, digital logic devices are common in products that impact public safety, including applications in transportation and human implants. Accurate testing has become more critical…to reliability, safety, and the bottom line. Yet, as digital systems become more ubiquitous and complex, the challenge of testing them has become more difficult. As one development group designing a RISC stated, "the work required to . . . test a chip of this size approached the amount of effort required to design it." A valued reference for nearly two decades, Digital Logic Testing and Simulation has been significantly revised and updated for designers and test engineers who must meet this challenge. There is no single solution to the testing problem. Organized in an easy-to-follow, sequential format, this Second Edition familiarizes the reader with the many different strategies for testing and their applications, and assesses the strengths and weaknesses of the various approaches. The book reviews the building blocks of a successful testing strategy and guides the reader on choosing the best solution for a particular application. Digital Logic Testing and Simulation, Second Edition covers such key topics as: Binary Decision Diagrams (BDDs) and cycle-based simulation Tester architectures/Standard Test Interface Language (STIL) Practical algorithms written in a Hardware Design Language (HDL) Fault tolerance Behavioral Automatic Test Pattern Generation (ATPG) The development of the Test Design Expert (TDX), the many obstacles encountered and lessons learned in creating this novel testing approach Up-to-date and comprehensive, Digital Logic Testing and Simulation is an important resource for anyone charged with pinpointing faulty products and assuring quality, safety, and profitability.

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Da: Ria Christie Collections, Uxbridge, Regno UnitoRia Christie Collections
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EUR 192,50
EUR 13,86 spedizioneSpedito da Regno Unito a U.S.A.Quantità: Più di 20 disponibili
Condizione: New. In.

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Da: Majestic Books, Hounslow, , Regno UnitoMajestic Books
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EUR 238,78
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Condizione: New. pp. xxii + 668 Illus.

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Da: Kennys Bookshop and Art Galleries Ltd., Galway, GY, IrlandaKennys Bookshop and Art Galleries Ltd.
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EUR 243,00
EUR 10,50 spedizioneSpedito da Irlanda a U.S.A.Quantità: Più di 20 disponibili
Condizione: New. Your road map for meeting today's digital testing challenges Today, digital logic devices are common in products that impact public safety, including applications in transportation and human implants. Accurate testing has become more critical to reliability, safety, and the bottom line. Num Pages: 696 pages, Ill…ustrations. BIC Classification: TJ. Category: (P) Professional & Vocational. Dimension: 243 x 165 x 43. Weight in Grams: 1130. . 2003. 2nd Edition. Hardcover. . . . .

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Da: Books Puddle, New York, NY, U.S.A.Books Puddle
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EUR 262,17
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Condizione: New. pp. xxii + 668 Index 2nd Edition.

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Da: Revaluation Books, Exeter, , Regno UnitoRevaluation Books
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EUR 282,48
EUR 17,36 spedizioneSpedito da Regno Unito a U.S.A.Quantità: 2 disponibili
Hardcover. Condizione: Brand New. 2nd edition. 668 pages. 9.50x6.50x1.25 inches. In Stock.

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Da: Kennys Bookstore, Olney, MD, U.S.A.Kennys Bookstore
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EUR 305,79
EUR 9,06 spedizioneSpedito in U.S.A.Quantità: Più di 20 disponibili
Condizione: New. Your road map for meeting today's digital testing challenges Today, digital logic devices are common in products that impact public safety, including applications in transportation and human implants. Accurate testing has become more critical to reliability, safety, and the bottom line. Num Pages: 696 pages, Ill…ustrations. BIC Classification: TJ. Category: (P) Professional & Vocational. Dimension: 243 x 165 x 43. Weight in Grams: 1130. . 2003. 2nd Edition. Hardcover. . . . . Books ship from the US and Ireland.

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Da: AHA-BUCH GmbH, Einbeck, GermaniaAHA-BUCH GmbH
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EUR 261,98
EUR 65,97 spedizioneSpedito da Germania a U.S.A.Quantità: 2 disponibili
Buch. Condizione: Neu. Neuware - Your road map for meeting today s digital testing challengesToday, digital logic devices are common in products that impact public safety, including applications in transportation and human implants. Accurate testing has become more critical to reliability, safety, and the bottom line. Yet, as di…gital systems become more ubiquitous and complex, the challenge of testing them has become more difficult. As one development group designing a RISC stated, 'the work required to . . . test a chip of this size approached the amount of effort required to design it.' A valued reference for nearly two decades, Digital Logic Testing and Simulation has been significantly revised and updated for designers and test engineers who must meet this challenge.There is no single solution to the testing problem. Organized in an easy-to-follow, sequential format, this Second Edition familiarizes the reader with the many different strategies for testing and their applications, and assesses the strengths and weaknesses of the various approaches. The book reviews the building blocks of a successful testing strategy and guides the reader on choosing the best solution for a particular application. Digital Logic Testing and Simulation, Second Edition covers such key topics as: Binary Decision Diagrams (BDDs) and cycle-based simulation Tester architectures/Standard Test Interface Language (STIL) Practical algorithms written in a Hardware Design Language (HDL) Fault tolerance Behavioral Automatic Test Pattern Generation (ATPG) The development of the Test Design Expert (TDX), the many obstacles encountered and lessons learned in creating this novel testing approachUp-to-date and comprehensive, Digital Logic Testing and Simulation is an important resource for anyone charged with pinpointing faulty products and assuring quality, safety, and profitability.

- Rilegato
Da: GreatBookPricesUK, Woodford Green, Regno UnitoGreatBookPricesUK
Contatta il venditoreVenditore con 5 stelleCondizione: Usato - Come nuovo
EUR 358,80
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Condizione: As New. Unread book in perfect condition.

- Rilegato
Da: Mispah books, Redhill, SURRE, Regno UnitoMispah books
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EUR 349,27
EUR 28,93 spedizioneSpedito da Regno Unito a U.S.A.Quantità: 1 disponibili
Hardcover. Condizione: Like New. Like New. book.

- Rilegato
Da: GreatBookPrices, Columbia, MD, U.S.A.GreatBookPrices
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EUR 388,19
EUR 2,28 spedizioneSpedito in U.S.A.Quantità: Più di 20 disponibili
Condizione: As New. Unread book in perfect condition.

- Rilegato
- Print on Demand
Da: CitiRetail, Stevenage, Regno UnitoCitiRetail
Contatta il venditoreVenditore con 5 stelleCondizione: Nuovo
EUR 205,61
EUR 42,82 spedizioneSpedito da Regno Unito a U.S.A.Quantità: 1 disponibili
Hardcover. Condizione: new. Hardcover. Your road map for meeting today's digital testing challenges Today, digital logic devices are common in products that impact public safety, including applications in transportation and human implants. Accurate testing has become more critical to reliability, safety, and the bottom line. Yet…, as digital systems become more ubiquitous and complex, the challenge of testing them has become more difficult. As one development group designing a RISC stated, "the work required to . . . test a chip of this size approached the amount of effort required to design it." A valued reference for nearly two decades, Digital Logic Testing and Simulation has been significantly revised and updated for designers and test engineers who must meet this challenge. There is no single solution to the testing problem. Organized in an easy-to-follow, sequential format, this Second Edition familiarizes the reader with the many different strategies for testing and their applications, and assesses the strengths and weaknesses of the various approaches. The book reviews the building blocks of a successful testing strategy and guides the reader on choosing the best solution for a particular application. Digital Logic Testing and Simulation, Second Edition covers such key topics as: * Binary Decision Diagrams (BDDs) and cycle-based simulation * Tester architectures/Standard Test Interface Language (STIL) * Practical algorithms written in a Hardware Design Language (HDL) * Fault tolerance * Behavioral Automatic Test Pattern Generation (ATPG) * The development of the Test Design Expert (TDX), the many obstacles encountered and lessons learned in creating this novel testing approach Up-to-date and comprehensive, Digital Logic Testing and Simulation is an important resource for anyone charged with pinpointing faulty products and assuring quality, safety, and profitability. Your road map for meeting today's digital testing challenges Today, digital logic devices are common in products that impact public safety, including applications in transportation and human implants. Accurate testing has become more critical to reliability, safety, and the bottom line. This item is printed on demand. Shipping may be from our UK warehouse or from our Australian or US warehouses, depending on stock availability.

- Rilegato
- Print on Demand
Da: Revaluation Books, Exeter, , Regno UnitoRevaluation Books
Contatta il venditoreVenditore con 5 stelleCondizione: Nuovo
EUR 259,85
EUR 17,36 spedizioneSpedito da Regno Unito a U.S.A.Quantità: 2 disponibili
Hardcover. Condizione: Brand New. 2nd edition. 668 pages. 9.50x6.50x1.25 inches. In Stock. This item is printed on demand.