Editore: Reading, MA, U.S.A.: Addison-Wesley Educational Publishers, Incorporated, 1985, 1985
ISBN 10: 0060444444 ISBN 13: 9780060444440
Lingua: Inglese
Da: Bingo Used Books, Vancouver, WA, U.S.A.
EUR 4,36
Convertire valutaQuantità: 1 disponibili
Aggiungi al carrelloHardcover. Condizione: Very Good. Hardcover in very good + condition.
Editore: Addison-Wesley Educational Publishers, Incorporated, 1985
ISBN 10: 0060444444 ISBN 13: 9780060444440
Lingua: Inglese
Da: Better World Books: West, Reno, NV, U.S.A.
EUR 10,93
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Aggiungi al carrelloCondizione: Good. Former library book; may include library markings. Used book that is in clean, average condition without any missing pages.
Editore: Reading, MA, U.S.A. : Addison-Wesley Educational Publishers,., 1986
ISBN 10: 0060444444 ISBN 13: 9780060444440
Lingua: Inglese
Da: Virginia Martin, aka bookwitch, Concord, CA, U.S.A.
EUR 12,23
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Aggiungi al carrelloCondizione: Very Good. Octavo, hardcover, near fine in white pictorial boards. Clean and unmarked. 414 pp New algorithms are being devised to create tests for logic circuits, and more attention is being given to design for test techniques. In this comprehensive volume the state of the art in digital system design and testing is discussed. (as per 1985). Book.
EUR 14,95
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Aggiungi al carrellohardcover. Condizione: Good. Connecting readers with great books since 1972! Used textbooks may not include companion materials such as access codes, etc. May have some wear or writing/highlighting. We ship orders daily and Customer Service is our top priority!
EUR 15,03
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Aggiungi al carrellohardcover. Condizione: Good. Hardcover book. The exterior can have some minor wear. Pages are age-toned. All items ship Monday - Saturday - Fast Shipping in a secure package. Your purchase will help support the programs and collections of the Johnson County (Kansas) Library.
EUR 3,30
Convertire valutaQuantità: 1 disponibili
Aggiungi al carrelloCondizione: Fair. This is an ex-library book and may have the usual library/used-book markings inside.This book has soft covers. In fair condition, suitable as a study copy. Please note the Image in this listing is a stock photo and may not match the covers of the actual item,650grams, ISBN:047161307X.
Editore: Somerset, New Jersey, U.S.A.: John Wiley & Sons Inc, 1986
ISBN 10: 0471603651 ISBN 13: 9780471603658
Lingua: Inglese
Da: Bingo Used Books, Vancouver, WA, U.S.A.
EUR 13,30
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Aggiungi al carrelloHardcover. Condizione: Very Good. hardcover in very good + condition.
EUR 15,96
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Aggiungi al carrelloHardcover. Condizione: Acceptable. Connecting readers with great books since 1972. Used textbooks may not include companion materials such as access codes, etc. May have condition issues including wear and notes/highlighting. We ship orders daily and Customer Service is our top priority!
EUR 4,19
Convertire valutaQuantità: 1 disponibili
Aggiungi al carrelloCondizione: Good. This is an ex-library book and may have the usual library/used-book markings inside.This book has soft covers. Clean from markings. In good all round condition. Please note the Image in this listing is a stock photo and may not match the covers of the actual item,650grams, ISBN:047161307X.
EUR 22,75
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Aggiungi al carrelloCondizione: Poor. This is an ex-library book and may have the usual library/used-book markings inside.This book has hardback covers. In poor condition, suitable as a reading copy. No dust jacket. Water damaged. Please note the Image in this listing is a stock photo and may not match the covers of the actual item,750grams, ISBN:0060444444.
EUR 22,75
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Aggiungi al carrelloCondizione: Fair. This is an ex-library book and may have the usual library/used-book markings inside.This book has hardback covers. Book contains pencil markings. In fair condition, suitable as a study copy. No dust jacket. Please note the Image in this listing is a stock photo and may not match the covers of the actual item,750grams, ISBN:0060444444.
Editore: Harper & Row, New York, 1985
ISBN 10: 0060444444 ISBN 13: 9780060444440
Da: Between the Covers-Rare Books, Inc. ABAA, Gloucester City, NJ, U.S.A.
Prima edizione
EUR 31,03
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Aggiungi al carrelloHardcover. Condizione: Fine. First edition. Near fine. Spine darkened just a little.
EUR 169,72
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Aggiungi al carrelloCondizione: Very Good. hardcover 100% of proceeds go to charity! May have signs of use, wear and minor cosmetic defects.
EUR 188,60
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Aggiungi al carrelloCondizione: New.
EUR 187,42
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Aggiungi al carrelloCondizione: New.
EUR 181,49
Convertire valutaQuantità: 15 disponibili
Aggiungi al carrelloHRD. Condizione: New. New Book. Shipped from UK. Established seller since 2000.
EUR 181,47
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Aggiungi al carrelloCondizione: New.
EUR 186,30
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Aggiungi al carrelloCondizione: New. In.
EUR 214,79
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Aggiungi al carrelloCondizione: As New. Unread book in perfect condition.
Editore: John Wiley & Sons Inc, New York, 2003
ISBN 10: 0471439959 ISBN 13: 9780471439950
Lingua: Inglese
Da: Grand Eagle Retail, Bensenville, IL, U.S.A.
EUR 223,03
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Aggiungi al carrelloHardcover. Condizione: new. Hardcover. Your road map for meeting today's digital testing challenges Today, digital logic devices are common in products that impact public safety, including applications in transportation and human implants. Accurate testing has become more critical to reliability, safety, and the bottom line. Yet, as digital systems become more ubiquitous and complex, the challenge of testing them has become more difficult. As one development group designing a RISC stated, "the work required to . . . test a chip of this size approached the amount of effort required to design it." A valued reference for nearly two decades, Digital Logic Testing and Simulation has been significantly revised and updated for designers and test engineers who must meet this challenge. There is no single solution to the testing problem. Organized in an easy-to-follow, sequential format, this Second Edition familiarizes the reader with the many different strategies for testing and their applications, and assesses the strengths and weaknesses of the various approaches. The book reviews the building blocks of a successful testing strategy and guides the reader on choosing the best solution for a particular application. Digital Logic Testing and Simulation, Second Edition covers such key topics as: * Binary Decision Diagrams (BDDs) and cycle-based simulation * Tester architectures/Standard Test Interface Language (STIL) * Practical algorithms written in a Hardware Design Language (HDL) * Fault tolerance * Behavioral Automatic Test Pattern Generation (ATPG) * The development of the Test Design Expert (TDX), the many obstacles encountered and lessons learned in creating this novel testing approach Up-to-date and comprehensive, Digital Logic Testing and Simulation is an important resource for anyone charged with pinpointing faulty products and assuring quality, safety, and profitability. Your road map for meeting today's digital testing challenges Today, digital logic devices are common in products that impact public safety, including applications in transportation and human implants. Accurate testing has become more critical to reliability, safety, and the bottom line. Shipping may be from multiple locations in the US or from the UK, depending on stock availability.
EUR 213,71
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Aggiungi al carrelloCondizione: As New. Unread book in perfect condition.
Editore: John Wiley & Sons Inc, New York, 2003
ISBN 10: 0471439959 ISBN 13: 9780471439950
Lingua: Inglese
Da: CitiRetail, Stevenage, Regno Unito
EUR 203,19
Convertire valutaQuantità: 1 disponibili
Aggiungi al carrelloHardcover. Condizione: new. Hardcover. Your road map for meeting today's digital testing challenges Today, digital logic devices are common in products that impact public safety, including applications in transportation and human implants. Accurate testing has become more critical to reliability, safety, and the bottom line. Yet, as digital systems become more ubiquitous and complex, the challenge of testing them has become more difficult. As one development group designing a RISC stated, "the work required to . . . test a chip of this size approached the amount of effort required to design it." A valued reference for nearly two decades, Digital Logic Testing and Simulation has been significantly revised and updated for designers and test engineers who must meet this challenge. There is no single solution to the testing problem. Organized in an easy-to-follow, sequential format, this Second Edition familiarizes the reader with the many different strategies for testing and their applications, and assesses the strengths and weaknesses of the various approaches. The book reviews the building blocks of a successful testing strategy and guides the reader on choosing the best solution for a particular application. Digital Logic Testing and Simulation, Second Edition covers such key topics as: * Binary Decision Diagrams (BDDs) and cycle-based simulation * Tester architectures/Standard Test Interface Language (STIL) * Practical algorithms written in a Hardware Design Language (HDL) * Fault tolerance * Behavioral Automatic Test Pattern Generation (ATPG) * The development of the Test Design Expert (TDX), the many obstacles encountered and lessons learned in creating this novel testing approach Up-to-date and comprehensive, Digital Logic Testing and Simulation is an important resource for anyone charged with pinpointing faulty products and assuring quality, safety, and profitability. Your road map for meeting today's digital testing challenges Today, digital logic devices are common in products that impact public safety, including applications in transportation and human implants. Accurate testing has become more critical to reliability, safety, and the bottom line. Shipping may be from our UK warehouse or from our Australian or US warehouses, depending on stock availability.
EUR 242,75
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Aggiungi al carrelloCondizione: New. pp. xxii + 668 Illus.
Da: Kennys Bookshop and Art Galleries Ltd., Galway, GY, Irlanda
EUR 242,22
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Aggiungi al carrelloCondizione: New. Your road map for meeting today's digital testing challenges Today, digital logic devices are common in products that impact public safety, including applications in transportation and human implants. Accurate testing has become more critical to reliability, safety, and the bottom line. Num Pages: 696 pages, Illustrations. BIC Classification: TJ. Category: (P) Professional & Vocational. Dimension: 243 x 165 x 43. Weight in Grams: 1130. . 2003. 2nd Edition. Hardcover. . . . .
EUR 258,95
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Aggiungi al carrelloCondizione: New. pp. xxii + 668 Index 2nd Edition.
Editore: John Wiley & Sons Inc, New York, 2003
ISBN 10: 0471439959 ISBN 13: 9780471439950
Lingua: Inglese
Da: AussieBookSeller, Truganina, VIC, Australia
EUR 269,18
Convertire valutaQuantità: 1 disponibili
Aggiungi al carrelloHardcover. Condizione: new. Hardcover. Your road map for meeting today's digital testing challenges Today, digital logic devices are common in products that impact public safety, including applications in transportation and human implants. Accurate testing has become more critical to reliability, safety, and the bottom line. Yet, as digital systems become more ubiquitous and complex, the challenge of testing them has become more difficult. As one development group designing a RISC stated, "the work required to . . . test a chip of this size approached the amount of effort required to design it." A valued reference for nearly two decades, Digital Logic Testing and Simulation has been significantly revised and updated for designers and test engineers who must meet this challenge. There is no single solution to the testing problem. Organized in an easy-to-follow, sequential format, this Second Edition familiarizes the reader with the many different strategies for testing and their applications, and assesses the strengths and weaknesses of the various approaches. The book reviews the building blocks of a successful testing strategy and guides the reader on choosing the best solution for a particular application. Digital Logic Testing and Simulation, Second Edition covers such key topics as: * Binary Decision Diagrams (BDDs) and cycle-based simulation * Tester architectures/Standard Test Interface Language (STIL) * Practical algorithms written in a Hardware Design Language (HDL) * Fault tolerance * Behavioral Automatic Test Pattern Generation (ATPG) * The development of the Test Design Expert (TDX), the many obstacles encountered and lessons learned in creating this novel testing approach Up-to-date and comprehensive, Digital Logic Testing and Simulation is an important resource for anyone charged with pinpointing faulty products and assuring quality, safety, and profitability. Your road map for meeting today's digital testing challenges Today, digital logic devices are common in products that impact public safety, including applications in transportation and human implants. Accurate testing has become more critical to reliability, safety, and the bottom line. Shipping may be from our Sydney, NSW warehouse or from our UK or US warehouse, depending on stock availability.
EUR 282,47
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Aggiungi al carrelloHardcover. Condizione: Brand New. 2nd edition. 668 pages. 9.50x6.50x1.25 inches. In Stock.
EUR 304,87
Convertire valutaQuantità: Più di 20 disponibili
Aggiungi al carrelloCondizione: New. Your road map for meeting today's digital testing challenges Today, digital logic devices are common in products that impact public safety, including applications in transportation and human implants. Accurate testing has become more critical to reliability, safety, and the bottom line. Num Pages: 696 pages, Illustrations. BIC Classification: TJ. Category: (P) Professional & Vocational. Dimension: 243 x 165 x 43. Weight in Grams: 1130. . 2003. 2nd Edition. Hardcover. . . . . Books ship from the US and Ireland.
EUR 241,29
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Aggiungi al carrelloBuch. Condizione: Neu. Neuware - Your road map for meeting today s digital testing challenges Today, digital logic devices are common in products that impact public safety, including applications in transportation and human implants. Accurate testing has become more critical to reliability, safety, and the bottom line. Yet, as digital systems become more ubiquitous and complex, the challenge of testing them has become more difficult. As one development group designing a RISC stated, 'the work required to . . . test a chip of this size approached the amount of effort required to design it.' A valued reference for nearly two decades, Digital Logic Testing and Simulation has been significantly revised and updated for designers and test engineers who must meet this challenge. There is no single solution to the testing problem. Organized in an easy-to-follow, sequential format, this Second Edition familiarizes the reader with the many different strategies for testing and their applications, and assesses the strengths and weaknesses of the various approaches. The book reviews the building blocks of a successful testing strategy and guides the reader on choosing the best solution for a particular application. Digital Logic Testing and Simulation, Second Edition covers such key topics as: Binary Decision Diagrams (BDDs) and cycle-based simulation Tester architectures/Standard Test Interface Language (STIL) Practical algorithms written in a Hardware Design Language (HDL) Fault tolerance Behavioral Automatic Test Pattern Generation (ATPG) The development of the Test Design Expert (TDX), the many obstacles encountered and lessons learned in creating this novel testing approach Up-to-date and comprehensive, Digital Logic Testing and Simulation is an important resource for anyone charged with pinpointing faulty products and assuring quality, safety, and profitability.
EUR 324,66
Convertire valutaQuantità: 1 disponibili
Aggiungi al carrelloPaperback. Condizione: Acceptable. Acceptable. book.