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EUR 103,66
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Da: Ria Christie Collections, Uxbridge, Regno Unito
EUR 115,11
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EUR 118,64
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Aggiungi al carrelloGebunden. Condizione: New. Very few books discuss fault-tolerance techniques for SRAM-based FPGAsShows state-of-the-art fault tolerance solutions for FPGAsShows fault-tolerance techniques that can be applied in different design phasesDiscusses the main differe.
EUR 115,10
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EUR 120,97
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EUR 127,04
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Da: Ria Christie Collections, Uxbridge, Regno Unito
EUR 134,57
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EUR 142,52
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EUR 150,25
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Aggiungi al carrelloPaperback. Condizione: Brand New. 183 pages. 9.00x6.00x0.46 inches. In Stock.
Da: Revaluation Books, Exeter, Regno Unito
EUR 152,21
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Aggiungi al carrelloHardcover. Condizione: Brand New. 1st edition. 183 pages. 9.25x6.00x0.75 inches. In Stock.
Da: Lucky's Textbooks, Dallas, TX, U.S.A.
EUR 102,14
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Da: Lucky's Textbooks, Dallas, TX, U.S.A.
EUR 102,48
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Editore: Springer-Verlag New York Inc., New York, NY, 2006
ISBN 10: 0387310681 ISBN 13: 9780387310688
Lingua: Inglese
Da: Grand Eagle Retail, Mason, OH, U.S.A.
EUR 105,97
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Aggiungi al carrelloHardcover. Condizione: new. Hardcover. Fault-tolerance in integrated circuits is not an exclusive concern regarding space designers or highly-reliable application engineers. Rather, designers of next generation products must cope with reduced margin noises due to technological advances. The continuous evolution of the fabrication technology process of semiconductor components, in terms of transistor geometry shrinking, power supply, speed, and logic density, has significantly reduced the reliability of very deep submicron integrated circuits, in face of the various internal and external sources of noise. The very popular Field Programmable Gate Arrays, customizable by SRAM cells, are a consequence of the integrated circuit evolution with millions of memory cells to implement the logic, embedded memories, routing, and more recently with embedded microprocessors cores. These re-programmable systems-on-chip platforms must be fault-tolerant to cope with present days requirements. This book discusses fault-tolerance techniques for SRAM-based Field Programmable Gate Arrays (FPGAs). It starts by showing the model of the problem and the upset effects in the programmable architecture. In the sequence, it shows the main fault tolerance techniques used nowadays to protect integrated circuits against errors. A large set of methods for designing fault tolerance systems in SRAM-based FPGAs is described. Some presented techniques are based on developing a new fault-tolerant architecture with new robustness FPGA elements. Other techniques are based on protecting the high-level hardware description before the synthesis in the FPGA. The reader has the flexibility of choosing the most suitable fault-tolerance technique for its project and to compare a set of fault tolerant techniques for programmable logic applications. The reader has the flexibility of choosing the most suitable fault-tolerance technique for its project and to compare a set of fault tolerant techniques for programmable logic applications. Shipping may be from multiple locations in the US or from the UK, depending on stock availability.
EUR 162,93
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Aggiungi al carrelloBuch. Condizione: Neu. Neuware - Fault-tolerance in integrated circuits is not an exclusive concern regarding space designers or highly-reliable application engineers. Rather, designers of next generation products must cope with reduced margin noises due to technological advances. The continuous evolution of the fabrication technology process of semiconductor components, in terms of transistor geometry shrinking, power supply, speed, and logic density, has significantly reduced the reliability of very deep submicron integrated circuits, in face of the various internal and external sources of noise. The very popular Field Programmable Gate Arrays, customizable by SRAM cells, are a consequence of the integrated circuit evolution with millions of memory cells to implement the logic, embedded memories, routing, and more recently with embedded microprocessors cores. These re-programmable systems-on-chip platforms must be fault-tolerant to cope with present days requirements. This book discusses fault-tolerance techniques for SRAM-based Field Programmable Gate Arrays (FPGAs). It starts by showing the model of the problem and the upset effects in the programmable architecture. In the sequence, it shows the main fault tolerance techniques used nowadays to protect integrated circuits against errors. A large set of methods for designing fault tolerance systems in SRAM-based FPGAs is described. Some presented techniques are based on developing a new fault-tolerant architecture with new robustness FPGA elements. Other techniques are based on protecting the high-level hardware description before the synthesis in the FPGA. The reader has the flexibility of choosing the most suitable fault-tolerance technique for its project and to compare a set of fault tolerant techniques for programmable logic applications.
Editore: Springer-Verlag New York Inc., New York, NY, 2006
ISBN 10: 0387310681 ISBN 13: 9780387310688
Lingua: Inglese
Da: AussieBookSeller, Truganina, VIC, Australia
EUR 196,54
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Aggiungi al carrelloHardcover. Condizione: new. Hardcover. Fault-tolerance in integrated circuits is not an exclusive concern regarding space designers or highly-reliable application engineers. Rather, designers of next generation products must cope with reduced margin noises due to technological advances. The continuous evolution of the fabrication technology process of semiconductor components, in terms of transistor geometry shrinking, power supply, speed, and logic density, has significantly reduced the reliability of very deep submicron integrated circuits, in face of the various internal and external sources of noise. The very popular Field Programmable Gate Arrays, customizable by SRAM cells, are a consequence of the integrated circuit evolution with millions of memory cells to implement the logic, embedded memories, routing, and more recently with embedded microprocessors cores. These re-programmable systems-on-chip platforms must be fault-tolerant to cope with present days requirements. This book discusses fault-tolerance techniques for SRAM-based Field Programmable Gate Arrays (FPGAs). It starts by showing the model of the problem and the upset effects in the programmable architecture. In the sequence, it shows the main fault tolerance techniques used nowadays to protect integrated circuits against errors. A large set of methods for designing fault tolerance systems in SRAM-based FPGAs is described. Some presented techniques are based on developing a new fault-tolerant architecture with new robustness FPGA elements. Other techniques are based on protecting the high-level hardware description before the synthesis in the FPGA. The reader has the flexibility of choosing the most suitable fault-tolerance technique for its project and to compare a set of fault tolerant techniques for programmable logic applications. The reader has the flexibility of choosing the most suitable fault-tolerance technique for its project and to compare a set of fault tolerant techniques for programmable logic applications. Shipping may be from our Sydney, NSW warehouse or from our UK or US warehouse, depending on stock availability.
Da: moluna, Greven, Germania
EUR 92,27
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Aggiungi al carrelloCondizione: New. Dieser Artikel ist ein Print on Demand Artikel und wird nach Ihrer Bestellung fuer Sie gedruckt. Very few books discuss fault-tolerance techniques for SRAM-based FPGAsShows state-of-the-art fault tolerance solutions for FPGAsShows fault-tolerance techniques that can be applied in different design phasesDiscusses the main differe.
Editore: Springer-Verlag New York Inc., 2006
ISBN 10: 0387310681 ISBN 13: 9780387310688
Lingua: Inglese
Da: THE SAINT BOOKSTORE, Southport, Regno Unito
EUR 135,21
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Aggiungi al carrelloHardback. Condizione: New. This item is printed on demand. New copy - Usually dispatched within 5-9 working days 489.
Da: Majestic Books, Hounslow, Regno Unito
EUR 149,35
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Aggiungi al carrelloCondizione: New. Print on Demand pp. 200 49:B&W 6.14 x 9.21 in or 234 x 156 mm (Royal 8vo) Perfect Bound on White w/Gloss Lam.
Da: Biblios, Frankfurt am main, HESSE, Germania
EUR 152,84
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Aggiungi al carrelloCondizione: New. PRINT ON DEMAND pp. 200.