Transmission electron microscopy diffraction (68 risultati)

Soft cover. Condizione: Fair. 222 numbered pages; A thesis by Paul Vincent Guthrie, Jr.; hole-punched to put in notebook; bound at this time by 3 stainless steel pins; minor age tan to text; med age tan and numerous speck/ marks to edges of closed pages; medium wear to edges of cover; medium handgrime to cover; a number of minor marks to cover; 1/4 inch tear to back cover; ex-library; weighs 2.25 pounds; measures 10.8 by 8.5 by .8 inches; 091813; inventory control: SB.…

Condizione: As New. Unread book in perfect condition.

Hardcover. Condizione: Good. Cover boards are slightly bowing/bending. Otherwise book is in great condition with minimal/no other wear, crisp pages showing unmarked text/pictures, and intact binding of the text block. A good reading copy.

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Condizione: New. pages cm.

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PAP. Condizione: New. New Book. Shipped from UK. Established seller since 2000.

Condizione: New. pages cm 1st edition Includes bibliographical references and index.

Condizione: As New. Unread book in perfect condition.

PAP. Condizione: New. New Book. Shipped from UK. Established seller since 2000.

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Paperback / softback. Condizione: New. New copy - Usually dispatched within 4 working days.

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Paperback. Condizione: New. The structure-property relationship is a key topic in materials science and engineering. To understand why a material displays certain behaviors, the first step is to resolve its crystal structure and reveal its structure characteristics. Fundamentals of Crystallography, Powder X-ray Diffraction, and Transmission Electron Microscopy for Materials Scientists equips readers with an in-depth understanding of using powder x-ray diffraction and transmission electron microscopy for the analysis of crystal structures.Introduces fundamentals of crystallographyCovers XRD of materials, including geometry and intensity of diffracted x-ray beams and experimental methodsDescribes TEM of materials and includes atomic scattering factors, electron diffraction, and diffraction and phase contrastsDiscusses applications of HRTEM in materials researchExplains concepts used in XRD and TEM lab trainingBased on the author's course lecture notes, this text guides materials science and engineering students with minimal reliance on advanced mathematics. It will also appeal to a broad spectrum of readers, including researchers and professionals working in the disciplines of materials science and engineering, applied physics, and chemical engineering. …

Paperback. Condizione: Brand New. 272 pages. 9.18x6.12x9.21 inches. In Stock.

Paperback. Condizione: Brand New. 710 pages. 11.00x8.75x1.50 inches. In Stock.

paperback. Condizione: New. Language:Chinese.Paperback. Pub Date: 2024-06 Pages: 240 Publisher: Metallurgical Industry Press This book consists of 3 parts. The first part is an introduction to crystallography. including the periodicity of crystals and Bravais lattices. the symmetry. point groups and space groups of crystals. examples of reciprocal lattices and crystal structure characterization; the second part is the X-ray diffraction of materials. including the geometric principles of X-ray diffraction. the diffractio.…

Condizione: Brand New. New. US edition. Expediting shipping for all USA and Europe orders excluding PO Box. Excellent Customer Service.

Condizione: New. This is a Brand-new US Edition. This Item may be shipped from US or any other country as we have multiple locations worldwide.

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Condizione: New. Brand New! Fast Delivery This is an International Edition and ship within 24-48 hours. Deliver by FedEx and Dhl, & Aramex, UPS, & USPS and we do accept APO and PO BOX Addresses. Order can be delivered worldwide within 6-10 days and we do have flat rate for up to 2LB. Extra shipping charges will be requested if the Book weight is more than 5 LB. This Item May be shipped from India, United states & United Kingdom. Depending on your location and availability.…

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Condizione: New. In English.

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Condizione: New. 1st edition NO-PA16APR2015-KAP.

Taschenbuch. Condizione: Neu. Druck auf Anfrage Neuware - Printed after ordering - This volume expands and updates the coverage in the authors' popular 1992 book, Electron Microdiffraction. As the title implies, the focus of the book has changed from electron microdiffraction and convergent beam electron diffraction to all forms of advanced transmission electron microscopy. Special attention is given to electron diffraction and imaging, including high-resolution TEM and STEM imaging, and the application of these methods to crystals, their defects, and nanostructures. The authoritative text summarizes and develops most of the useful knowledge which has been gained over the years from the study of the multiple electron scattering problem, the recent development of aberration correctors and their applications to materials structure characterization, as well as the authors' extensive teaching experience in these areas. Advanced Transmission Electron Microscopy: Imaging and Diffraction in Nanoscience is ideal for use as an advanced undergraduate or graduatelevel text in support of course materials in Materials Science, Physics or Chemistry departments.…

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Hardcover. Condizione: Brand New. 518 pages. 11.00x8.25x1.25 inches. In Stock.

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