Articoli correlati a Neutron and X-Ray Microscopy: Part A: Volume 172
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This special volume of Advances in Imaging and Electron Physics details the current theory, experiments, and applications of neutron and x-ray optics and microscopy for an international readership across varying backgrounds and disciplines. Edited by Dr. Ted Cremer, these volumes attempt to provide rapid assimilation of the presented topics that include neutron and x-ray scatter, refraction, diffraction, and reflection and their potential application.
- Contributions from leading authorities
- Informs and updates on all the latest developments in the field
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Advances in Imaging and Electron Physics
Editore:
Elsevier Science & Technology, Academic Press, 2012
ISBN 10: 0123944228
ISBN 13: 9780123944221
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Da: BuchWeltWeit Ludwig Meier e.K., Bergisch Gladbach, Germania
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Buch. Condizione: Neu. This item is printed on demand - it takes 3-4 days longer - Neuware -This special volume of Advances in Imaging and Electron Physics details the current theory, experiments, and applications of neutron and x-ray optics and microscopy for an international readership across varying backgrounds and disciplines. Edited by Dr. Ted Cremer, these volumes attempt to provide rapid assimilation of the presented topics that include neutron and x-ray scatter, refraction, diffraction, and reflection and their potential application. Englisch. Codice articolo 9780123944221
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EUR 185,00
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Spedito da Germania a U.S.A.
Spedito da Germania a U.S.A.
Quantità: 2 disponibili
Immagini fornite dal venditore
Advances in Imaging and Electron Physics : Part A
Editore:
Elsevier Science & Technology, Academic Press, 2012
ISBN 10: 0123944228
ISBN 13: 9780123944221
Nuovo
Rilegato
Da: AHA-BUCH GmbH, Einbeck, Germania
Valutazione del venditore 5 su 5 stelle
Buch. Condizione: Neu. nach der Bestellung gedruckt Neuware - Printed after ordering - This special volume of Advances in Imaging and Electron Physics details the current theory, experiments, and applications of neutron and x-ray optics and microscopy for an international readership across varying backgrounds and disciplines. Edited by Dr. Ted Cremer, these volumes attempt to provide rapid assimilation of the presented topics that include neutron and x-ray scatter, refraction, diffraction, and reflection and their potential application. Codice articolo 9780123944221
Compra nuovo
EUR 220,58
Spedizione EUR 44,00
Spedito da Germania a U.S.A.
Spedito da Germania a U.S.A.
Quantità: 2 disponibili