High Resolution X-Ray Diffractometry And Topography - Brossura

Bowen, D.K.; Tanner, Brian K.

Brossura

ISBN 10: 0367400634 ISBN 13: 9780367400637

Casa editrice: CRC Press, 2019

Riassunto

The study and application of electronic materials has created an increasing demand for sophisticated and reliable techniques for examining and characterizing these materials. This comprehensive book looks at the area of x-ray diffraction and the modern techniques available for deployment in research, development, and production. It provides the theoretical and practical background for applying these techniques in scientific and industrial materials characterization. The main aim of the book is to map the theoretical and practical background necessary to the study of single crystal materials by means of high-resolution x-ray diffraction and topography. It combines mathematical formalisms with graphical explanations and hands-on practical advice for interpreting data.

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Informazioni sull?autore

Bowen, D.K.; Tanner, Brian K.

Dettagli dell'edizione

• Editore: CRC Press
• Data di pubblicazione: 2019
• Lingua: Inglese
• ISBN 10: 0367400634
• ISBN 13: 9780367400637
• Rilegatura: Copertina flessibile
• Numero edizione: 1
• Numero di pagine: 264
• Contatto del produttore: Taylor and Francis, GPSR Taylor and Francis; gpsr@taylorandfrancis.com; ; Taylor & Francis Verlag GmbH, Kaufingerstraße 24; München; 80331; Germania