Physical Principles of Electron Microscopy: An Introduction to Tem, Sem, and Aem - Rilegato

Egerton, R. F.

 
9780387258003: Physical Principles of Electron Microscopy: An Introduction to Tem, Sem, and Aem
Rilegato
ISBN 10: 0387258000 ISBN 13: 9780387258003
Casa editrice: Springer-Verlag GmbH, 2005

Sinossi

Scanning and stationary-beam electron microscopes have become an indespensible tool for both research and routine evaluation in materials science, the semiconductor industry, nanotechnology and the biological, forensic, and medical sciences.

Le informazioni nella sezione "Riassunto" possono far riferimento a edizioni diverse di questo titolo.

Dalla quarta di copertina

Scanning and stationary-beam electron microscopes have become an indispensable tool for both research and routine evaluation in materials science, the semiconductor industry, nanotechnology, and the biological and medical sciences. Physical Principles of Electron Microscopy provides an introduction to the theory and current practice of electron microscopy for undergraduate students who want to acquire an appreciation of how basic principles of physics are utilized in an important area of applied science, and for graduate students and technologists who make use of electron microscopes. At the same time, this book will be equally valuable for university teachers and researchers who need a concise supplemental text that deals with the basic principles of microscopy.

Le informazioni nella sezione "Su questo libro" possono far riferimento a edizioni diverse di questo titolo.

Editore
Springer-Verlag GmbH
Data di pubblicazione
2005
Lingua
Inglese
ISBN 10 
0387258000
ISBN 13 
9780387258003
Rilegatura
Copertina rigida
Numero edizione
2
Numero di pagine
202
Contatto del produttore
non disponibile
Persona responsabile
CMN Printpool Inh. Mathis Neumann
https://www.also.com/ec/cms5/en_6000/6000/index.jsp

Friedrich-Karl-Str. 9
Hamburg
Germania

Altre edizioni note dello stesso titolo

9783319819860: Physical Principles of Electron Microscopy: An Introduction to TEM, SEM, and AEM

Edizione in evidenza

ISBN 10:  3319819860 ISBN 13:  9783319819860
Casa editrice: Springer, 2018
Brossura