<p>This book presents scanning electron microscopy (SEM) fundamentals and applications for nanotechnology. It includes integrated fabrication techniques using the SEM, such as e-beam and FIB, and it covers in-situ nanomanipulation of materials. The book is written by international experts from the top nano-research groups that specialize in nanomaterials characterization. The book will appeal to nanomaterials researchers, and to SEM development specialists.</p>
Le informazioni nella sezione "Riassunto" possono far riferimento a edizioni diverse di questo titolo.
<p>Scanning electron microscopy (SEM) can be exploited not only for nanomaterials characterization but also integrated with new technologies for in-situ nanomaterials engineering and manipulation. <em>Scanning Microscopy for Nanotechnology</em> addresses the rapid development of these techniques for nanotechnology, in both technique and application chapters by leading practitioners. The book covers topics including nanomaterials imaging, X-ray microanalysis, high-resolution SEM, low kV SEM, cryo-SEM, as well as new techniques such as electron back scatter diffraction (EBSD) and scanning transmission electron microscopy (STEM). Fabrication techniques integrated with SEM, such as e-beam nanolithography, nanomanipulation, and focused ion beam nanofabrication, are major new dimensions for SEM application. Application areas include the study of nanoparticles, nanowires and nanotubes, three-dimensional nanostructures, quantum dots, magnetic nanomaterials, photonic structures, and bio-inspired nanomaterials. This book will appeal not only to a broad spectrum of nanomaterials researchers, but also to SEM development specialists.</p>
Le informazioni nella sezione "Su questo libro" possono far riferimento a edizioni diverse di questo titolo.
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hardcover. Condizione: As New. no jacket. 2006 hardcover with pictorial boards clean. Codice articolo 250108016
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Da: Majestic Books, Hounslow, Regno Unito
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Da: Biblios, Frankfurt am main, HESSE, Germania
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