Da: Anybook.com, Lincoln, Regno Unito
EUR 39,08
Quantità: 1 disponibili
Aggiungi al carrelloCondizione: Fair. This is an ex-library book and may have the usual library/used-book markings inside.This book has hardback covers. In fair condition, suitable as a study copy. Please note the Image in this listing is a stock photo and may not match the covers of the actual item,1100grams, ISBN:9780387333250.
Da: SMASS Sellers, IRVING, TX, U.S.A.
Condizione: New. Brand New Original US Edition. Customer service! Satisfaction Guaranteed.
Da: Romtrade Corp., STERLING HEIGHTS, MI, U.S.A.
Condizione: New. This is a Brand-new US Edition. This Item may be shipped from US or any other country as we have multiple locations worldwide.
Da: Basi6 International, Irving, TX, U.S.A.
Condizione: Brand New. New. US edition. Expediting shipping for all USA and Europe orders excluding PO Box. Excellent Customer Service.
Da: SMASS Sellers, IRVING, TX, U.S.A.
Condizione: New. Brand New Original US Edition. Customer service! Satisfaction Guaranteed.
Da: Basi6 International, Irving, TX, U.S.A.
Condizione: Brand New. New. US edition. Expediting shipping for all USA and Europe orders excluding PO Box. Excellent Customer Service.
Da: Ria Christie Collections, Uxbridge, Regno Unito
EUR 225,06
Quantità: Più di 20 disponibili
Aggiungi al carrelloCondizione: New. In.
Da: Ria Christie Collections, Uxbridge, Regno Unito
EUR 249,45
Quantità: Più di 20 disponibili
Aggiungi al carrelloCondizione: New. In.
Da: Mispah books, Redhill, SURRE, Regno Unito
EUR 254,78
Quantità: 1 disponibili
Aggiungi al carrelloHardcover. Condizione: Like New. Like New. book.
Lingua: Inglese
Editore: Springer, 2007
Da: Books in my Basket, New Delhi, India
EUR 276,04
Quantità: 1 disponibili
Aggiungi al carrelloHardcover. Condizione: New. ISBN:9780387333250.
Da: preigu, Osnabrück, Germania
EUR 213,95
Quantità: 5 disponibili
Aggiungi al carrelloTaschenbuch. Condizione: Neu. Scanning Microscopy for Nanotechnology | Techniques and Applications | Weilie Zhou (u. a.) | Taschenbuch | xiv | Englisch | 2010 | Springer | EAN 9781441922090 | Verantwortliche Person für die EU: Springer Verlag GmbH, Tiergartenstr. 17, 69121 Heidelberg, juergen[dot]hartmann[at]springer[dot]com | Anbieter: preigu.
Lingua: Inglese
Editore: Springer New York, Springer US, 2010
ISBN 10: 1441922091 ISBN 13: 9781441922090
Da: AHA-BUCH GmbH, Einbeck, Germania
EUR 255,74
Quantità: 1 disponibili
Aggiungi al carrelloTaschenbuch. Condizione: Neu. Druck auf Anfrage Neuware - Printed after ordering - Scanning electron microscopy (SEM) can be exploited not only for nanomaterials characterization but also integrated with new technologies for in-situ nanomaterials engineering and manipulation. Scanning Microscopy for Nanotechnology addresses the rapid development of these techniques for nanotechnology, in both technique and application chapters by leading practitioners. The book covers topics including nanomaterials imaging, X-ray microanalysis, high-resolution SEM, low kV SEM, cryo-SEM, as well as new techniques such as electron back scatter diffraction (EBSD) and scanning transmission electron microscopy (STEM). Fabrication techniques integrated with SEM, such as e-beam nanolithography, nanomanipulation, and focused ion beam nanofabrication, are major new dimensions for SEM application. Application areas include the study of nanoparticles, nanowires and nanotubes, three-dimensional nanostructures, quantum dots, magnetic nanomaterials, photonic structures, and bio-inspired nanomaterials. This book will appeal not only to a broad spectrum of nanomaterials researchers, but also to SEM development specialists.
Lingua: Inglese
Editore: Springer New York, Copernicus, 2006
ISBN 10: 0387333258 ISBN 13: 9780387333250
Da: AHA-BUCH GmbH, Einbeck, Germania
EUR 257,65
Quantità: 1 disponibili
Aggiungi al carrelloBuch. Condizione: Neu. Druck auf Anfrage Neuware - Printed after ordering - Scanning electron microscopy (SEM) can be exploited not only for nanomaterials characterization but also integrated with new technologies for in-situ nanomaterials engineering and manipulation. Scanning Microscopy for Nanotechnology addresses the rapid development of these techniques for nanotechnology, in both technique and application chapters by leading practitioners. The book covers topics including nanomaterials imaging, X-ray microanalysis, high-resolution SEM, low kV SEM, cryo-SEM, as well as new techniques such as electron back scatter diffraction (EBSD) and scanning transmission electron microscopy (STEM). Fabrication techniques integrated with SEM, such as e-beam nanolithography, nanomanipulation, and focused ion beam nanofabrication, are major new dimensions for SEM application. Application areas include the study of nanoparticles, nanowires and nanotubes, three-dimensional nanostructures, quantum dots, magnetic nanomaterials, photonic structures, and bio-inspired nanomaterials. This book will appeal not only to a broad spectrum of nanomaterials researchers, but also to SEM development specialists.
Da: UK BOOKS STORE, London, LONDO, Regno Unito
EUR 350,73
Quantità: 3 disponibili
Aggiungi al carrelloHardcover. Condizione: New. Brand New ! Fast Delivery "International Edition " and ship within 24-48 hours. Deliver by FedEx and Dhl, & Aramex, UPS, & USPS and we do accept APO and PO BOX Addresses. Order can be delivered worldwide within 4-6 Working days .and we do have flat rate for up to 2LB. Extra shipping charges will be requested This Item May be shipped from India, United states & United Kingdom. Depending on your location and availability.
Da: Revaluation Books, Exeter, Regno Unito
EUR 346,88
Quantità: 2 disponibili
Aggiungi al carrelloHardcover. Condizione: Brand New. 1st edition. 522 pages. 9.25x6.25x1.00 inches. In Stock.
Editore: SPRINGER, 2007
Da: Mispah books, Redhill, SURRE, Regno Unito
EUR 186,92
Quantità: 1 disponibili
Aggiungi al carrelloHardcover. Condizione: Like New. LIKE NEW. SHIPS FROM MULTIPLE LOCATIONS. book.