Scanning Probe Microscopy: Atomic Scale Engineering by Forces and Currents - Rilegato

Foster, Adam; Hofer, Werner A.

 
9780387400907: Scanning Probe Microscopy: Atomic Scale Engineering by Forces and Currents
Rilegato
ISBN 10: 0387400907 ISBN 13: 9780387400907
Casa editrice: Springer-Verlag GmbH, 2006

Sinossi

The book discusses the analysis and manipulation of processes on the atomic scale by forces and currents and gives a broad overview from a common perspective on the different fields of Scanning Probe Microscopy (SPM). Such a combined treatment is suggested theoretically, because both are just different aspects of physical and chemical processes at atomic interfaces. Forces do play an important role in Scanning Tunneling Microscopy (STM), and currents are an important issue in Atomic Force Microscopy (AFM). Experimentally, the existence of instruments for combined force/current measurements make the same point. This unique overview fills the gap in the litterature. USP: -Unique treatment of both Atomic Force Microscopy and Scanning Tunneling Microscopy -Written by leading experts -Gives a broad overview both from theory and experiments

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Dalla quarta di copertina

Scanning Probe Microscopy provides a comprehensive source of information for researchers, teachers, and graduate students about the rapidly expanding field of scanning probe theory. Written in the style of a textbook, it explains from scratch the theory behind today’s simulation techniques and gives examples of theoretical concepts through state-of-the-art simulations, including the means to compare these results with experimental data. The book provides the first comprehensive framework for electron transport theory with its various degrees of approximations used in today’s research, thus allowing extensive insight into the physics of scanning probes. Experimentalists will appreciate how the instrument's operation is changed by materials properties; theorists will understand how simulations can be directly compared to experimental data.

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Editore
Springer-Verlag GmbH
Data di pubblicazione
2006
Lingua
Inglese
ISBN 10 
0387400907
ISBN 13 
9780387400907
Rilegatura
Copertina rigida
Numero di pagine
282
Contatto del produttore
non disponibile
Persona responsabile
ProductSafety@springernature.com
ProductSafety@springernature.com

Poststr. 9
Darmstadt
64293
Germania

Altre edizioni note dello stesso titolo

9781441923066: Scanning Probe Microscopy: Atomic Scale Engineering by Forces and Currents

Edizione in evidenza

ISBN 10:  1441923063 ISBN 13:  9781441923066
Casa editrice: Springer, 2010
Brossura