Transmission Electron Microscopy: Physics of Image Formation: 36 - Rilegato

Reimer, Ludwig; Kohl, Helmut

Rilegato

ISBN 10: 0387400931 ISBN 13: 9780387400938

Casa editrice: Springer-Verlag New York Inc., 2008

Riassunto

Transmission Electron Microscopy presents the theory of image and contrast formation, and the analytical modes in transmission electron microscopy. The principles of particle and wave optics of electrons are described. Electron-specimen interactions are discussed for evaluating the theory of scattering and phase contrast. Also discussed are the kinematical and dynamical theories of electron diffraction and their applications for crystal-structure analysis and imaging of lattices and their defects. X-ray micronanalysis and electron energy-loss spectroscopy are treated as analytical methods. Specimen damage and contamination by electron irradiation limits the resolution for biological and some inorganic specimens. This fifth edition includes discussion of recent progress, especially in the area of aberration corrector, and energy filtering; moreover the new topics of the forth edition have been updated again. USP: -Standard reference book -Now updated by the successor of the original author -New topics of the field included -Gives a comprehensive review of recent progresses in TEM

Su questo libro

Dalla quarta di copertina

Transmission Electron Microscopy: Physics of Image Formation presents the theory of image and contrast formation, and the analytical modes in transmission electron microscopy. The principles of particle and wave optics of electrons are described. Electron-specimen interactions are discussed for evaluating the theory of scattering and phase contrast. Also discussed are the kinematical and dynamical theories of electron diffraction and their applications for crystal-structure analysis and imaging of lattices and their defects. X-ray microanalysis and electron energy-loss spectroscopy are treated as analytical methods. Specimen damage and contamination by electron irradiation limits the resolution for biological and some inorganic specimens. This fifth edition includes discussion of recent progress, especially in the area of aberration correction and energy filtering; moreover, the topics introduced in the fourth edition have been updated.

Transmission Electron Microscopy: Physics of Image Formation is written for scientists and application engineers in fields such as physics, chemistry, mineralogy, materials science and biology. Researchers, students, and other users of a transmission electron microscope can also benefit from this text.

Dettagli dell'edizione

• Editore: Springer-Verlag New York Inc.
• Data di pubblicazione: 2008
• Lingua: Inglese
• ISBN 10: 0387400931
• ISBN 13: 9780387400938
• Rilegatura: Copertina rigida
• Numero edizione: 5
• Numero di pagine: 606
• Contatto del produttore: non disponibile
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