Testing and Diagnosis of Analog Circuits and Systems - Rilegato

Rilegato

ISBN 10: 0442259328 ISBN 13: 9780442259327

Casa editrice: Van Nostrand Reinhold, 1991

Riassunto

During the past 25 years, electronic engineering has witnessed tremendous strides in design, but maintenance of analog electronics has changed little since the vacuum tube, the ability to design complex circuits being greater than the ability to maintain them. The contributors to this volume offer current, theoretical and practical, analog testing and fault diagnosis data. The topics include linear vs. nonlinear methods, a searching approach self-testing algorithm, an artificial intelligence approach, automatic testing for control systems, and a unified theory on test generation. Annotation copyright Book News, Inc. Portland, Or.

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Contenuti

1. A Circuit Theoretic Approach to Analog Fault Diagnosis.- Background.- An Introduction to Analog Fault Diagnosis.- Important Issues of Analog Fault Diagnosis.- The Element-Value Solvability Problem.- A Fault/Tolerance Compensation Model.- k-Fault Diagnosis: The Ideal Case.- k-Fault Diagnosis: The Tolerance Case.- Illustrative Examples.- 2. Linear Method vs. Nonlinear Method.- Setting of the Problem.- Probability.- Probability Measure.- Perturbation of Parameters.- Geometry of SF and TF.- Linear Method Is as Powerful as the Nonlinear Method.- 3. Topological Testability Conditions for Analog Fault Diagnosis.- Theory.- Applications.- 4. Fault Diagnosis of Nonlinear Electronic Circuits.- Fault Diagnosis of Linear Circuits.- Fault Diagnosis of PWL Circuits.- Examples.- 5. Analog Multifrequency Fault Diagnosis with the Assumption of Limited Failures.- The CCM and the Fault Diagnosis Equations of [4].- A Motivational Example.- Diagnosability for nf Faults.- Limited Fault Algorithm.- Limited Fault Algorithm Examples.- 6. A Searching Approach Self-Testing Algorithm for Analog Fault Diagnosis.- Automatic Test Program Generation.- Decision Algorithms.- The Heuristic Algorithm.- Parallel Processing for Analog Fault Diagnosis.- Design for Testability.- 7. An Artificial Intelligence Approach to Analog Systems Diagnosis.- Qualitative Causal Models.- The Treatment of Fault Probabilities.- Best Test Strategies.- FIS: An Implemented Diagnostic System.- Current Applications of FIS.- 8. Automatic Testing for Control Systems Conformance.- Historical Development of ATE.- Transfer Function Testing.- Return Signal Processing.- Tuning of Large Electro-Mechanical Servosystems.- The SUT Test Signature.- Transfer Function Models of Control Systems.- The “Fuzzy” Nature of Control System Behavior.- Checkout Based on Quadratic Performance Criteria.- “Closed Loop” Testing.- 9. Testing of Analog Integrated Circuits.- Testing vs. Diagnosis.- Digital vs. Analog Testing.- Specification-Based Testing.- Solution of the Test Tolerance Assignment Problem.- Consideration for Fault-Model-Based Testing.- An Approach to Fault-Model-Based Testing.- 10. A Unified Theory on Test Generation for Analog/Digital Systems.- Notation and Basic Concepts.- Testability of Interconnected Systems.- Reachability, Observability, and Testability.- Test Generation for Interconnected Systems: Case Studies.

Dettagli dell?edizione

• Editore: Van Nostrand Reinhold
• Data di pubblicazione: 1991
• ISBN 10: 0442259328
• ISBN 13: 9780442259327
• Rilegatura: Copertina rigida
• Lingua: Inglese
• Numero edizione: 1
• Numero di pagine: 284
• Redattore: Liu Ruey-Wen