Computed Electron Micrographs and Defect Identification - Rilegato

 
9780444104625: Computed Electron Micrographs and Defect Identification

Altre edizioni note dello stesso titolo

9780444569974: Computed Electron Micrographs and Defect Identification, Volume 7

Edizione in evidenza

ISBN 10:  0444569979 ISBN 13:  9780444569974
Casa editrice: North Holland, 2012
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