Articoli correlati a Built-In Test for Vsli: Pseudorandom Techniques

Built-In Test for Vsli: Pseudorandom Techniques - Rilegato

Bardell, Paul H.; McAnney, William H.; Savir, Jacob

 
9780471624639: Built-In Test for Vsli: Pseudorandom Techniques
Rilegato
ISBN 10: 0471624632 ISBN 13: 9780471624639
Casa editrice: Wiley-Interscience, 1987

Sinossi

This handbook provides ready access to all of the major concepts, techniques, problems, and solutions in the emerging field of pseudorandom pattern testing. Until now, the literature in this area has been widely scattered, and published work, written by professionals in several disciplines, has treated notation and mathematics in ways that vary from source to source. This book opens with a clear description of the shortcomings of conventional testing as applied to complex digital circuits, revewing by comparison the principles of design for testability of more advanced digital technology. Offers in-depth discussions of test sequence generation and response data compression, including pseudorandom sequence generators; the mathematics of shift-register sequences and their potential for built-in testing. Also details random and memory testing and the problems of assessing the efficiency of such tests, and the limitations and practical concerns of built-in testing.

Le informazioni nella sezione "Riassunto" possono far riferimento a edizioni diverse di questo titolo.

Informazioni sull'autore

Paul H. Bardell and W. H. McAnney are the authors of Built In Test for VLSI: Pseudorandom Techniques, published by Wiley.

Le informazioni nella sezione "Su questo libro" possono far riferimento a edizioni diverse di questo titolo.

Editore
Wiley-Interscience
Data di pubblicazione
1987
Lingua
Inglese
ISBN 10 
0471624632
ISBN 13 
9780471624639
Rilegatura
Copertina rigida
Numero di pagine
368
Contatto del produttore
non disponibile
Persona responsabile
non disponibile