Sinossi
A self-contained book on electron microscopy and spectrometry techniques for surface studies.
Le informazioni nella sezione "Riassunto" possono far riferimento a edizioni diverse di questo titolo.
Recensione
'A very complete review of all work performed in reflection electron microscopy with an exhaustive bibliography ... It forms an exciting support for the understanding of surface studies by reflection electron microscopy. Illustrated by many beautiful and pertinent REM images and well-designed line drawings, this book should certainly be useful for graduate students and scientists working on surface characterization.' Andre Rocher, Measurement Science & Technology
'For those with a TEM background it represents, perhaps, the definitive text for reflection methods ... extremely readable ... attractive style ... Dr. Wang is to be congratulated on writing a very accesible text. The book is thoroughly recommended.' John F. Watts, The Analyst
' ... a very pleasing volume which should attract new users to these techniques.' P. W. Hawkes, Ultramicroscopy
' ... this book provides a comprehensive review of theory, techniques and applications of reflection electron microscopy.' Aslib Book Guide
Descrizione del libro
Entirely self-contained, this book serves as a comprehensive source for graduate students and working scientists using electron microscopy and spectrometry techniques for surface studies. The text is written to combine basic techniques with special applications, theories with experiments giving a complete coverage of RHEED and REM.
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Reflection Electron Microscopy and Spectroscopy for Surface Analysis
Editore:
Cambridge University Press, 1996
ISBN 10: 0521482666
ISBN 13: 9780521482660
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Da: Anybook.com, Lincoln, Regno Unito
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Condizione: Good. This is an ex-library book and may have the usual library/used-book markings inside.This book has hardback covers. Clean from markings. In good all round condition. Dust jacket in good condition. Please note the Image in this listing is a stock photo and may not match the covers of the actual item,1200grams, ISBN:9780521482660. Codice articolo 8976068
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Reflection Electron Microscopy and Spectroscopy for Surface Analysis (Hardcover)
Editore:
Cambridge University Press, Cambridge, 1996
ISBN 10: 0521482666
ISBN 13: 9780521482660
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Da: Grand Eagle Retail, Bensenville, IL, U.S.A.
Valutazione del venditore 5 su 5 stelle
Hardcover. Condizione: new. Hardcover. In this book the theories, techniques and applications of reflection electron microscopy (REM), reflection high-energy electron diffraction (RHEED) and reflection electron energy-loss spectroscopy (REELS) are comprehensively reviewed for the first time. The book is divided into three parts: diffraction, imaging and spectroscopy. The text is written to combine basic techniques with special applications, theories with experiments, and the basic physics with materials science, so that a full picture of RHEED and REM emerges. An entirely self-contained study, the book contains much invaluable reference material, including FORTRAN source codes for calculating crystal structures data and electron energy loss spectra in different scattering geometries. This and many other features make the book an important and timely addition to the materials science literature. This book is a source for graduate students and working scientists using electron microscopy and spectrometry techniques for surface studies. The text is written to combine basic techniques with special applications, theories with experiments giving a complete coverage of RHEED and REM. This item is printed on demand. Shipping may be from multiple locations in the US or from the UK, depending on stock availability. Codice articolo 9780521482660
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Reflection Electron Microscopy and Spectroscopy for Surface Analysis
Da: California Books, Miami, FL, U.S.A.
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Condizione: New. Codice articolo I-9780521482660
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Reflection Electron Microscopy and Spectroscopy for Surface Analysis
Da: Ria Christie Collections, Uxbridge, Regno Unito
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Condizione: New. In. Codice articolo ria9780521482660_new
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Reflection Electron Microscopy and Spectroscopy for Surface Analysis
Editore:
Cambridge University Press, 1996
ISBN 10: 0521482666
ISBN 13: 9780521482660
Antico o usato
Rilegato
Da: Mispah books, Redhill, SURRE, Regno Unito
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Hardcover. Condizione: Like New. LIKE NEW. SHIPS FROM MULTIPLE LOCATIONS. book. Codice articolo ERICA79005214826666
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Reflection Electron Microscopy and Spectroscopy for Surface Analysis
Print on DemandDa: Revaluation Books, Exeter, Regno Unito
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Hardcover. Condizione: Brand New. 436 pages. 10.25x7.25x1.00 inches. In Stock. This item is printed on demand. Codice articolo __0521482666
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Reflection Electron Microscopy and Spectroscopy for Surface Analysis
Print on DemandDa: THE SAINT BOOKSTORE, Southport, Regno Unito
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Hardback. Condizione: New. This item is printed on demand. New copy - Usually dispatched within 5-9 working days. Codice articolo C9780521482660
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Reflection Electron Microscopy and Spectroscopy for Surface Analysis
Print on DemandDa: moluna, Greven, Germania
Valutazione del venditore 4 su 5 stelle
Condizione: New. Dieser Artikel ist ein Print on Demand Artikel und wird nach Ihrer Bestellung fuer Sie gedruckt. Entirely self-contained, this book serves as a comprehensive source for graduate students and working scientists using electron microscopy and spectrometry techniques for surface studies. The text is written to combine basic techniques with special applicat. Codice articolo 446937372
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Reflection Electron Microscopy and Spectroscopy for Surface Analysis (Hardcover)
Editore:
Cambridge University Press, Cambridge, 1996
ISBN 10: 0521482666
ISBN 13: 9780521482660
Nuovo
Rilegato
Da: CitiRetail, Stevenage, Regno Unito
Valutazione del venditore 5 su 5 stelle
Hardcover. Condizione: new. Hardcover. In this book the theories, techniques and applications of reflection electron microscopy (REM), reflection high-energy electron diffraction (RHEED) and reflection electron energy-loss spectroscopy (REELS) are comprehensively reviewed for the first time. The book is divided into three parts: diffraction, imaging and spectroscopy. The text is written to combine basic techniques with special applications, theories with experiments, and the basic physics with materials science, so that a full picture of RHEED and REM emerges. An entirely self-contained study, the book contains much invaluable reference material, including FORTRAN source codes for calculating crystal structures data and electron energy loss spectra in different scattering geometries. This and many other features make the book an important and timely addition to the materials science literature. This book is a source for graduate students and working scientists using electron microscopy and spectrometry techniques for surface studies. The text is written to combine basic techniques with special applications, theories with experiments giving a complete coverage of RHEED and REM. This item is printed on demand. Shipping may be from our UK warehouse or from our Australian or US warehouses, depending on stock availability. Codice articolo 9780521482660
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EUR 170,34
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Reflection Electron Microscopy and Spectroscopy for Surface Analysis
Da: Revaluation Books, Exeter, Regno Unito
Valutazione del venditore 5 su 5 stelle
Hardcover. Condizione: Brand New. 436 pages. 10.25x7.25x1.00 inches. In Stock. Codice articolo x-0521482666
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EUR 218,53
Spedizione EUR 17,35
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