Isbn: 9780521482660 - reflection electron microscopy and spectroscopy for surface analysis (12 risultati)

Condizione: Good. This is an ex-library book and may have the usual library/used-book markings inside.This book has hardback covers. Clean from markings. In good all round condition. Dust jacket in good condition. Please note the Image in this listing is a stock photo and may not match the covers of the actual item,1200grams, ISBN:9780521482660.…

Condizione: New.

Condizione: New. A self-contained book on electron microscopy and spectrometry techniques for surface studies. Num Pages: 458 pages, 224 b/w illus. 10 tables. BIC Classification: PHK; TGM. Category: (P) Professional & Vocational. Dimension: 247 x 174 x 25. Weight in Grams: 1097. . 1996. hardcover. . . . . …

Condizione: New. In English.

Condizione: New. A self-contained book on electron microscopy and spectrometry techniques for surface studies. Num Pages: 458 pages, 224 b/w illus. 10 tables. BIC Classification: PHK; TGM. Category: (P) Professional & Vocational. Dimension: 247 x 174 x 25. Weight in Grams: 1097. . 1996. hardcover. . . . . Books ship from the US and Ireland. …

Hardcover. Condizione: Brand New. 436 pages. 10.25x7.25x1.00 inches. In Stock.

Buch. Condizione: Neu. Druck auf Anfrage Neuware - Printed after ordering - In this book the theories, techniques and applications of reflection electron microscopy (REM), reflection high-energy electron diffraction (RHEED) and reflection electron energy-loss spectroscopy (REELS) are comprehensively reviewed for the first time. The book is divided into three parts: diffraction, imaging and spectroscopy. The text is written to combine basic techniques with special applications, theories with experiments, and the basic physics with materials science, so that a full picture of RHEED and REM emerges. An entirely self-contained study, the book contains much invaluable reference material, including FORTRAN source codes for calculating crystal structures data and electron energy loss spectra in different scattering geometries. This and many other features make the book an important and timely addition to the materials science literature.…

Hardcover. Condizione: Like New. LIKE NEW. SHIPS FROM MULTIPLE LOCATIONS. book.

Hardcover. Condizione: new. Hardcover. In this book the theories, techniques and applications of reflection electron microscopy (REM), reflection high-energy electron diffraction (RHEED) and reflection electron energy-loss spectroscopy (REELS) are comprehensively reviewed for the first time. The book is divided into three parts: diffraction, imaging and spectroscopy. The text is written to combine basic techniques with special applications, theories with experiments, and the basic physics with materials science, so that a full picture of RHEED and REM emerges. An entirely self-contained study, the book contains much invaluable reference material, including FORTRAN source codes for calculating crystal structures data and electron energy loss spectra in different scattering geometries. This and many other features make the book an important and timely addition to the materials science literature. This book is a source for graduate students and working scientists using electron microscopy and spectrometry techniques for surface studies. The text is written to combine basic techniques with special applications, theories with experiments giving a complete coverage of RHEED and REM. This item is printed on demand. Shipping may be from our UK warehouse or from our Australian or US warehouses, depending on stock availability.…

Condizione: New. Dieser Artikel ist ein Print on Demand Artikel und wird nach Ihrer Bestellung fuer Sie gedruckt. Entirely self-contained, this book serves as a comprehensive source for graduate students and working scientists using electron microscopy and spectrometry techniques for surface studies. The text is written to combine basic techniques with special applicat.…

Hardback. Condizione: New. This item is printed on demand. New copy - Usually dispatched within 5-9 working days.

Buch. Condizione: Neu. Reflection Electron Microscopy and Spectroscopy for Surface Analysis | Zhong Lin Wang | Buch | Gebunden | Englisch | 2015 | Cambridge University Press | EAN 9780521482660 | Verantwortliche Person für die EU: Libri GmbH, Europaallee 1, 36244 Bad Hersfeld, gpsr[at]libri[dot]de | Anbieter: preigu Print on Demand.…