Semiconductor Memories: Technology, Testing, and Reliability - Rilegato

Sharma, Ashok K.; Rajsuman, Rochit

 
9780780310001: Semiconductor Memories: Technology, Testing, and Reliability

Sinossi

Semiconductor Memories provides in-depth coverage in the areas of design for testing, fault tolerance, failure modes and mechanisms, and screening and qualification methods including.
* Memory cell structures and fabrication technologies.
* Application-specific memories and architectures.
* Memory design, fault modeling and test algorithms, limitations, and trade-offs.
* Space environment, radiation hardening process and design techniques, and radiation testing.
* Memory stacks and multichip modules for gigabyte storage.

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Informazioni sull?autore

ASHOK K. SHARMA is the author of Semiconductor Memories: Technology, Testing, and Reliability. He is currently working as a reliability engineering manager at NASA, Goddard Space Flight Center, Greenbelt, Maryland.

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Altre edizioni note dello stesso titolo

9780471462439: Semiconductor Memories

Edizione in evidenza

ISBN 10:  0471462438 ISBN 13:  9780471462439
Casa editrice: IEEE, 2003
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