Particle Characterization: Light Scattering Methods: 13 - Rilegato

Libro 9 di 25: Particle Technology

Xu, Renliang

 
9780792363002: Particle Characterization: Light Scattering Methods: 13

Sinossi

Particle characterization is an important component in product research and development, manufacture, and quality control of particulate materials and an important tool in the frontier of sciences, such as in biotechnology and nanotechnology. This text systematically describes one major branch of modern particle characterization technology - the light scattering methods. It takes the form of a monograph covering the principles, instrumentation, data interpretation, applications, and modern experimental development in laser diffraction, optical particle counting, photon correlation spectroscopy, and electrophoretic light scattering. In addition, a summary of all major particle sizing and other characterization methods, basic statistics and sample preparation techniques used in particle characterization, as well as almost 500 references are provided. The title should be useful for industrial users of light scattering techniques characterizing a variety of particulate systems and for undergraduate or graduate students who want to learn how to use light scattering to study particular materials, in chemical engineering, material sciences, physical chemistry and other related fields.

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Contenuti

Preface. Acknowledgements. 1. Particle Characterization - An Overview. 2. Light Scattering - The Background Information. 3. Laser Diffraction - Sizing from Nanometers to Millimeters. 4. Optical Particle Counting - Counting and Sizing. 5. Photon Correlation Spectroscopy - Submicron Particle Characterization. 6. Electrophoretic Light Scattering - Zeta Potential Measurement. Appendices. Author Index. Subject Index.

Product Description

Book by Xu Renliang

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Altre edizioni note dello stesso titolo

9781402003578: Particle Characterization: Light Scattering Methods: 13

Edizione in evidenza

ISBN 10:  1402003579 ISBN 13:  9781402003578
Casa editrice: Springer, 2008
Brossura