On-Line Testing for VLSI: 11 - Brossura

Brossura

ISBN 10: 1441950338 ISBN 13: 9781441950338

Casa editrice: Springer, 2010

Riassunto

Test functions (fault detection, diagnosis, error correction, repair, etc.) that are applied concurrently while the system continues its intended function are defined as on-line testing. In its expanded scope, on-line testing includes the design of concurrent error checking subsystems that can be themselves self-checking, fail-safe systems that continue to function correctly even after an error occurs, reliability monitoring, and self-test and fault-tolerant designs.
On-Line Testing for VLSI contains a selected set of articles that discuss many of the modern aspects of on-line testing as faced today. The contributions are largely derived from recent IEEE International On-Line Testing Workshops. Guest editors Michael Nicolaidis, Yervant Zorian and Dhiraj Pradhan organized the articles into six chapters. In the first chapter the editors introduce a large number of approaches with an expanded bibliography in which some references date back to the sixties.
On-Line Testing for VLSI is an edited volume of original research comprising invited contributions by leading researchers.

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Contenuti

Foreword; V. Agrawal. 1: Introduction. 1.1. On-Testing for VLSI-A Compendium of Approaches; M. Nicolaidis, Y. Zorian. 2: Self-Checking Design. 2.1. On-Line Fault Monitoring; J.J. Stiffler. 2.2. Efficient Totally Self-Checking Shifter Design; R.O. Duarte, et al. 2.3. A New Design Method for Self-Checking Unidirectional Combinational Circuits; V.S. Saposhnikov, et al. 2.4. Concurrent Delay Detection in Duplication Systems; A. Paschalis, et al. 3: Self-Checking Checkers. 3.1. Design of Self-Testing Checkers for m-out-of-n Codes Using Parallel Counters; S.J. Piestrak. 3.2. Self-Testing Embedded Two-Rail Checkers; D. Nikolos. 4: On-Line Monitoring of Reliability Indicators. 4.1. Thermal Monitoring of Self-Checking Systems; V. Székeley, et al. 4.2. Integrated Temperature Sensors for On-Line Thermal Monitoring of Microelectronics Structures; K. Arabi, B. Kaminska. 4.3. Clocked Dosimeter Compatible Digital CMOS; E.G. Moreno, et al. 5: Built-In Self-Test. 5.1. Design of Scalable Hardware Test Generators for On-Line BIST; H. Al-Asaad, et al. 5.2. Mixed Mode BIST Using Embedded Processors; S. Hellebrand, et al. 5.3. A BIST Scheme for Non-Volatile Memories; P. Olivo, M. Dalpasso. 6: Fault Tolerant Systems. 6.1. On-Line Fault Resilience through Gracefully Degradable ASICs; A. Orailoglu. 6.2. Delivering Dependable Telecommunication Services Using Off-the-Shelf System Components; Y. Levendel.

Dettagli dell'edizione

• Editore: Springer
• Data di pubblicazione: 2010
• Lingua: Inglese
• ISBN 10: 1441950338
• ISBN 13: 9781441950338
• Rilegatura: Copertina flessibile
• Numero di pagine: 164
• Redattore: Nicolaidis Michael, Zorian Yervant, Pradhan Dhiraj
• Contatto del produttore: non disponibile
• Persona responsabile: Palgrave Macmillan; ProductSafety@springernature.com; ; Crinan Street 4; London; N1 9XW; Regno Unito