Analog Circuit Design for Process Variation-resilient Systems-on-a-chip - Rilegato

Onabajo, Marvin; Silva-Martinez, Jose

Rilegato

ISBN 10: 1461422957 ISBN 13: 9781461422952

Casa editrice: Springer Verlag, 2012

Riassunto

This book describes several techniques to address variation-related design challenges for analog blocks in mixed-signal systems-on-chip. The methods presented are results from recent research works involving receiver front-end circuits, baseband filter linearization, and data conversion. These circuit-level techniques are described, with their relationships to emerging system-level calibration approaches, to tune the performances of analog circuits with digital assistance or control. Coverage also includes a strategy to utilize on-chip temperature sensors to measure the signal power and linearity characteristics of analog/RF circuits, as demonstrated by test chip measurements.

• Describes a variety of variation-tolerant analog circuit design examples, including from RF front-ends, high-performance ADCs and baseband filters;
• Includes built-in testing techniques, linked to current industrial trends;
• Balances digitally-assisted performance tuning with analog performance tuning and mismatch reduction approaches;
• Describes theoretical concepts as well as experimental results for test chips designed with variation-aware techniques.

Su questo libro

Dalla quarta di copertina

This book describes several techniques to address variation-related design challenges for analog blocks in mixed-signal systems-on-chip. The methods presented are results from recent research works involving receiver front-end circuits, baseband filter linearization, and data conversion. These circuit-level techniques are described, with their relationships to emerging system-level calibration approaches, to tune the performances of analog circuits with digital assistance or control. Coverage also includes a strategy to utilize on-chip temperature sensors to measure the signal power and linearity characteristics of analog/RF circuits, as demonstrated by test chip measurements.

• Describes a variety of variation-tolerant analog circuit design examples, including from RF front-ends, high-performance ADCs and baseband filters;
• Includes built-in testing techniques, linked to current industrial trends;
• Balances digitally-assisted performance tuning with analog performance tuning and mismatch reduction approaches;
• Describes theoretical concepts as well as experimental results for test chips designed with variation-aware techniques.

Dettagli dell'edizione

• Editore: Springer Verlag
• Data di pubblicazione: 2012
• Lingua: Inglese
• ISBN 10: 1461422957
• ISBN 13: 9781461422952
• Rilegatura: Copertina rigida
• Numero di pagine: 250
• Contatto del produttore: ProductSafety@springernature.com; ProductSafety@springernature.com; ; Poststr. 9; Darmstadt; 64293; Germania