Articoli correlati a Key Concepts of Scanning Electron Microscopy

Key Concepts of Scanning Electron Microscopy - Rilegato

Page, Lisa

 
9781632383068: Key Concepts of Scanning Electron Microscopy
Rilegato
ISBN 10: 1632383063 ISBN 13: 9781632383068
Casa editrice: Ny Research Pr, 2015

Sinossi

This book on scanning electron microscopy examines the key concepts employed in the field. Fine focused electron and ion beams constitute(s) an inevitable part of methods and instruments employed in various science fields. SEMs are well instrumented and supplemented with advanced techniques and methods and thereby present endless possibilities in the areas of quantitative measurement of object topologies, surface imaging, performing elemental analysis and local electrophysical characteristics of semiconductor structures. Creation of micro and nanostructures involves extensive use of fine focused e-beam. This book focuses on various issues concerned with scanning electron microscopy, covering both theoretical and practical applications. It further includes numerous topics on geoscience, instrumentation, mineralogy, thin films, biology, ceramic and materials for electronic industry. This book includes contributions by renowned researchers and experts in this field.

Le informazioni nella sezione "Riassunto" possono far riferimento a edizioni diverse di questo titolo.

Editore
Ny Research Pr
Data di pubblicazione
2015
Lingua
Inglese
ISBN 10 
1632383063
ISBN 13 
9781632383068
Rilegatura
Copertina rigida
Numero di pagine
256
Contatto del produttore
non disponibile
Persona responsabile
gpsr@libri.de
gpsr@libri.de

Europaallee 1
Bad Hersfeld
36244
Germania