Scanning Probe Microscopy - Rilegato

Wright, Kate

 
9781632384072: Scanning Probe Microscopy
Rilegato
ISBN 10: 1632384078 ISBN 13: 9781632384072
Casa editrice: Ny Research Pr, 2015

Sinossi

Scanning Probe Microscopy (SPM) involves forming images of surfaces using a physical scanning and detection method. The key subject of this text, scanning probe microscopy is a major tool for the progress of nanotechnology with functions in a multitude of study spheres. This book comprises of unique studies on the uses of SPM methods for the classification of physical attributes of various materials at the nano level. The various topics covered in this book vary from morphology of surfaces to analyzing thin films. The diversity of topics covered in this book reflects the prominent interdisciplinary trait of the study in the sphere of scanning probe microscopy.

Le informazioni nella sezione "Riassunto" possono far riferimento a edizioni diverse di questo titolo.

Editore
Ny Research Pr
Data di pubblicazione
2015
Lingua
Inglese
ISBN 10 
1632384078
ISBN 13 
9781632384072
Rilegatura
Copertina rigida
Numero di pagine
256
Contatto del produttore
non disponibile
Persona responsabile
non disponibile