Failures caused by electrostatic discharges (ESD) constitute a major problem concerning the reliability and robustness of integrated circuits and electronic systems. This book summarizes the many diverse methodologies aimed at ESD protection and shows, through a number of concrete studies, that the best approach in terms of robustness and cost-effectiveness consists of implementing a global strategy of ESD protection. ESD Protection Methodologies begins by exploring the various normalized test techniques that are used to qualify ESD robustness as well as characterization and defect localization methods aimed at implementing corrective measures. Due to the increasing complexity of integrated circuits, it is important to be able to provide a simulation in which the implemented ESD protection strategy provides the desired protection, while not harming the performance levels of the circuit. Therefore, the main features and difficulties related to the different types of simulation, finite element, SPICE-type and behavioral, are then studied. To conclude, several case studies are presented which provide real-life examples of the approaches explained in the previous chapters and validate a number of the strategies from component to system level.
Le informazioni nella sezione "Riassunto" possono far riferimento a edizioni diverse di questo titolo.
Marise Bafleur is Research Director at the Laboratory for Analysis and Architecture of Systems (LAAS-CNRS) in Toulouse, France.
Fabrice Caignet is a Lecturer at Paul Sabatier University in Toulouse, France. .
Nicolas Nolhier is Professor in Electronics at Paul Sabatier University in Toulouse, France.
Le informazioni nella sezione "Su questo libro" possono far riferimento a edizioni diverse di questo titolo.
EUR 11,00 per la spedizione da Germania a Italia
Destinazione, tempi e costiDa: BuchWeltWeit Ludwig Meier e.K., Bergisch Gladbach, Germania
Buch. Condizione: Neu. This item is printed on demand - it takes 3-4 days longer - Neuware -Failures caused by electrostatic discharges (ESD) constitute a major problem concerning the reliability and robustness of integrated circuits and electronic systems. This book summarizes the many diverse methodologies aimed at ESD protection and shows, through a number of concrete studies, that the best approach in terms of robustness and cost-effectiveness consists of implementing a global strategy of ESD protection. ESD Protection Methodologies begins by exploring the various normalized test techniques that are used to qualify ESD robustness as well as characterization and defect localization methods aimed at implementing corrective measures. Due to the increasing complexity of integrated circuits, it is important to be able to provide a simulation in which the implemented ESD protection strategy provides the desired protection, while not harming the performance levels of the circuit. Therefore, the main features and difficulties related to the different types of simulation, finite element, SPICE-type and behavioral, are then studied. To conclude, several case studies are presented which provide real-life examples of the approaches explained in the previous chapters and validate a number of the strategies from component to system level. 284 pp. Englisch. Codice articolo 9781785481222
Quantità: 2 disponibili
Da: Brook Bookstore On Demand, Napoli, NA, Italia
Condizione: new. Questo è un articolo print on demand. Codice articolo 71031cac9fbc694f2b970aba31a29b31
Quantità: Più di 20 disponibili
Da: Majestic Books, Hounslow, Regno Unito
Condizione: New. pp. 210. Codice articolo 372148996
Quantità: 3 disponibili
Da: Revaluation Books, Exeter, Regno Unito
Hardcover. Condizione: Brand New. 257 pages. 9.25x6.25x1.00 inches. In Stock. Codice articolo __1785481223
Quantità: 2 disponibili
Da: AHA-BUCH GmbH, Einbeck, Germania
Buch. Condizione: Neu. nach der Bestellung gedruckt Neuware - Printed after ordering - Failures caused by electrostatic discharges (ESD) constitute a major problem concerning the reliability and robustness of integrated circuits and electronic systems. This book summarizes the many diverse methodologies aimed at ESD protection and shows, through a number of concrete studies, that the best approach in terms of robustness and cost-effectiveness consists of implementing a global strategy of ESD protection. ESD Protection Methodologies begins by exploring the various normalized test techniques that are used to qualify ESD robustness as well as characterization and defect localization methods aimed at implementing corrective measures. Due to the increasing complexity of integrated circuits, it is important to be able to provide a simulation in which the implemented ESD protection strategy provides the desired protection, while not harming the performance levels of the circuit. Therefore, the main features and difficulties related to the different types of simulation, finite element, SPICE-type and behavioral, are then studied. To conclude, several case studies are presented which provide real-life examples of the approaches explained in the previous chapters and validate a number of the strategies from component to system level. Codice articolo 9781785481222
Quantità: 2 disponibili
Da: THE SAINT BOOKSTORE, Southport, Regno Unito
Hardback. Condizione: New. New copy - Usually dispatched within 4 working days. 635. Codice articolo B9781785481222
Quantità: Più di 20 disponibili
Da: Books Puddle, New York, NY, U.S.A.
Condizione: New. pp. 210. Codice articolo 26374944987
Quantità: 3 disponibili
Da: Biblios, Frankfurt am main, HESSE, Germania
Condizione: New. pp. 210. Codice articolo 18374944977
Quantità: 3 disponibili