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Aggiungi al carrelloCondizione: New. pp. 210.
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Aggiungi al carrelloHardcover. Condizione: Brand New. 257 pages. 9.25x6.25x1.00 inches. In Stock.
Condizione: New. pp. 210.
Da: Biblios, Frankfurt am main, HESSE, Germania
EUR 94,60
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Aggiungi al carrelloCondizione: New. pp. 210.
Lingua: Francese
Editore: Hermes Science Publishing Ltd 2017-11-30, 2017
ISBN 10: 1784053260 ISBN 13: 9781784053260
Da: Chiron Media, Wallingford, Regno Unito
EUR 52,05
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Aggiungi al carrelloPaperback. Condizione: New.
Lingua: Inglese
Editore: ISTE Press Ltd - Elsevier Inc, 2017
ISBN 10: 1785481223 ISBN 13: 9781785481222
Da: THE SAINT BOOKSTORE, Southport, Regno Unito
EUR 90,50
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Aggiungi al carrelloHardback. Condizione: New. New copy - Usually dispatched within 4 working days.
Lingua: Francese
Editore: Hermes Science Publishing Ltd, GB, 2017
ISBN 10: 1784053260 ISBN 13: 9781784053260
Da: Rarewaves.com USA, London, LONDO, Regno Unito
EUR 71,89
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Aggiungi al carrelloPaperback. Condizione: New.
Lingua: Francese
Editore: Hermes Science Publishing Ltd, GB, 2017
ISBN 10: 1784053260 ISBN 13: 9781784053260
Da: Rarewaves.com UK, London, Regno Unito
EUR 62,96
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Aggiungi al carrelloPaperback. Condizione: New.
Da: Brook Bookstore On Demand, Napoli, NA, Italia
EUR 67,65
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Aggiungi al carrelloCondizione: new. Questo è un articolo print on demand.
Da: BuchWeltWeit Ludwig Meier e.K., Bergisch Gladbach, Germania
EUR 150,00
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Aggiungi al carrelloBuch. Condizione: Neu. This item is printed on demand - it takes 3-4 days longer - Neuware -Failures caused by electrostatic discharges (ESD) constitute a major problem concerning the reliability and robustness of integrated circuits and electronic systems. This book summarizes the many diverse methodologies aimed at ESD protection and shows, through a number of concrete studies, that the best approach in terms of robustness and cost-effectiveness consists of implementing a global strategy of ESD protection. ESD Protection Methodologies begins by exploring the various normalized test techniques that are used to qualify ESD robustness as well as characterization and defect localization methods aimed at implementing corrective measures. Due to the increasing complexity of integrated circuits, it is important to be able to provide a simulation in which the implemented ESD protection strategy provides the desired protection, while not harming the performance levels of the circuit. Therefore, the main features and difficulties related to the different types of simulation, finite element, SPICE-type and behavioral, are then studied. To conclude, several case studies are presented which provide real-life examples of the approaches explained in the previous chapters and validate a number of the strategies from component to system level. 284 pp. Englisch.
Da: AHA-BUCH GmbH, Einbeck, Germania
EUR 165,99
Quantità: 2 disponibili
Aggiungi al carrelloBuch. Condizione: Neu. nach der Bestellung gedruckt Neuware - Printed after ordering - Failures caused by electrostatic discharges (ESD) constitute a major problem concerning the reliability and robustness of integrated circuits and electronic systems. This book summarizes the many diverse methodologies aimed at ESD protection and shows, through a number of concrete studies, that the best approach in terms of robustness and cost-effectiveness consists of implementing a global strategy of ESD protection. ESD Protection Methodologies begins by exploring the various normalized test techniques that are used to qualify ESD robustness as well as characterization and defect localization methods aimed at implementing corrective measures. Due to the increasing complexity of integrated circuits, it is important to be able to provide a simulation in which the implemented ESD protection strategy provides the desired protection, while not harming the performance levels of the circuit. Therefore, the main features and difficulties related to the different types of simulation, finite element, SPICE-type and behavioral, are then studied. To conclude, several case studies are presented which provide real-life examples of the approaches explained in the previous chapters and validate a number of the strategies from component to system level.