Sinossi
1-Impacts of Process Variations and Aging on Lifetime Reliability of Flip-Flops
2-Restructuring-based Lifetime Reliability Improvement of Nano-scale Master-Slave Flip-Flops
3-Lifetime Reliability Improvement of Pulsed Flip-Flops
4-Gate Sizing-based Lifetime Reliability Improvement of Integrated Circuits
5-Joint Timing Yield and Lifetime Reliability Optimization of Integrated Circuits
6-Lifetime Reliability Optimization Algorithms of Integrated Circuits using Dual Threshold Voltage Assignment
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