Elastic and Inelastic Scattering in Electron Diffraction and Imaging: 205 - Rilegato

Wang, Zhong Lin

Rilegato

ISBN 10: 303190818X ISBN 13: 9783031908187

Casa editrice: Springer Nature, 2025

Riassunto

This book provides an in-depth exploration of the physics underlying electron diffraction and imaging, with a focus on their applications in materials characterization. Originally published in 1995, the first edition systematically summarized various dynamic theories associated with quantitative electron microscopy and their applications in simulations of electron diffraction patterns and images. Since then, significant progress has been made in the field, necessitating this revised second edition.

The second edition introduces new content, particularly emphasizing the diffraction and imaging of inelastically scattered electrons, a topic that has not been extensively covered in existing literature. This edition also includes updated theories and methodologies, reflecting the advancements in the field over the past decades. The book assumes that readers have a foundational understanding of electron microscopy, electron diffraction, and quantum mechanics. It aims to serve as a comprehensive guide for approaching phenomena observed in electron microscopy from the perspective of diffraction physics.

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Informazioni sull?autore

Dr. Zhong Lin Wang is a preeminent physicist and materials scientist whose groundbreaking work has revolutionized the fields of nanotechnology, energy harvesting, and self-powered systems. He currently serves as the director of the Beijing Institute of Nanoenergy and Nanosystems and holds the distinguished titles of Regents' Professor and Hightower Chair (Emeritus) at the Georgia Institute of Technology. Dr. Wang is widely recognized as the pioneer of the nanogenerators field, which has enabled advancements in distributed energy, self-powered sensors, and large-scale blue energy. Additionally, he coined and developed the fields of piezotronics and piezo-phototronics, which have significant implications for third-generation semiconductors. Wang has also made outstanding contribution to fundamentals of electron microscopy. Dr. Wang’s scientific impact is unparalleled.

Dalla quarta di copertina

This book provides an in-depth exploration of the physics underlying electron diffraction and imaging, with a focus on their applications in materials characterization. Originally published in 1995, the first edition systematically summarized various dynamic theories associated with quantitative electron microscopy and their applications in simulations of electron diffraction patterns and images. Since then, significant progress has been made in the field, necessitating this revised second edition.

The second edition introduces new content, particularly emphasizing the diffraction and imaging of inelastically scattered electrons, a topic that has not been extensively covered in existing literature. This edition also includes updated theories and methodologies, reflecting the advancements in the field over the past decades. The book assumes that readers have a foundational understanding of electron microscopy, electron diffraction, and quantum mechanics. It aims to serve as a comprehensive guide for approaching phenomena observed in electron microscopy from the perspective of diffraction physics.

Dettagli dell'edizione

• Editore: Springer Nature
• Data di pubblicazione: 2025
• Lingua: Inglese
• ISBN 10: 303190818X
• ISBN 13: 9783031908187
• Rilegatura: Copertina rigida
• Numero edizione: 2
• Numero di pagine: 528
• Contatto del produttore: ProductSafety@springernature.com; ProductSafety@springernature.com; ; Poststr. 9; Darmstadt; 64293; Germania