Isbn: 9783031908187 - elastic and inelastic scattering in electron diffraction and imaging: 205 (7 risultati)

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    • Lingua: Inglese

      Editore: Springer, 2025

      303190818X / 9783031908187

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      Condizione: New. Second Edition 2025 NO-PA16APR2015-KAP.

    • Lingua: Inglese

      Editore: Springer, 2025

      303190818X / 9783031908187

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    • Lingua: Inglese

      Editore: Springer, Berlin, Springer US, Springer Dez 2025, 2025

      303190818X / 9783031908187

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      Da: BuchWeltWeit Ludwig Meier e.K., Bergisch Gladbach, GermaniaBuchWeltWeit Ludwig Meier e.K.

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      Buch. Condizione: Neu. This item is printed on demand - it takes 3-4 days longer - Neuware -This book provides an in-depth exploration of the physics underlying electron diffraction and imaging, with a focus on their applications in materials characterization. Originally published in 1995, the first edition systematically summarized various dynamic theories associated with quantitative electron microscopy and their applications in simulations of electron diffraction patterns and images. Since then, significant progress has been made in the field, necessitating this revised second edition.The second edition introduces new content, particularly emphasizing the diffraction and imaging of inelastically scattered electrons, a topic that has not been extensively covered in existing literature. This edition also includes updated theories and methodologies, reflecting the advancements in the field over the past decades. The book assumes that readers have a foundational understanding of electron microscopy, electron diffraction, and quantum mechanics. It aims to serve as a comprehensive guide for approaching phenomena observed in electron microscopy from the perspective of diffraction physics. 495 pp. Englisch.

    • Lingua: Inglese

      Editore: Springer, Palgrave Macmillan Nov 2025, 2025

      303190818X / 9783031908187

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      Da: buchversandmimpf2000, Emtmannsberg, BAYE, Germaniabuchversandmimpf2000

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      Buch. Condizione: Neu. This item is printed on demand - Print on Demand Titel. Neuware -This book provides an in-depth exploration of the physics underlying electron diffraction and imaging, with a focus on their applications in materials characterization. Originally published in 1995, the first edition systematically summarized various dynamic theories associated with quantitative electron microscopy and their applications in simulations of electron diffraction patterns and images. Since then, significant progress has been made in the field, necessitating this revised second edition.Springer-Verlag KG, Sachsenplatz 4-6, 1201 Wien 528 pp. Englisch.

    • Lingua: Inglese

      Editore: Springer, 2025

      303190818X / 9783031908187

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      Da: Majestic Books, Hounslow, Regno UnitoMajestic Books

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    • Lingua: Inglese

      Editore: Springer, 2025

      303190818X / 9783031908187

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      Da: Biblios, frankfurt am main, HESSE, GermaniaBiblios

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    • Lingua: Inglese

      Editore: Humana, 2025

      303190818X / 9783031908187

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      Da: AHA-BUCH GmbH, Einbeck, GermaniaAHA-BUCH GmbH

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      Buch. Condizione: Neu. nach der Bestellung gedruckt Neuware - Printed after ordering - This book provides an in-depth exploration of the physics underlying electron diffraction and imaging, with a focus on their applications in materials characterization. Originally published in 1995, the first edition systematically summarized various dynamic theories associated with quantitative electron microscopy and their applications in simulations of electron diffraction patterns and images. Since then, significant progress has been made in the field, necessitating this revised second edition.The second edition introduces new content, particularly emphasizing the diffraction and imaging of inelastically scattered electrons, a topic that has not been extensively covered in existing literature. This edition also includes updated theories and methodologies, reflecting the advancements in the field over the past decades. The book assumes that readers have a foundational understanding of electron microscopy, electron diffraction, and quantum mechanics. It aims to serve as a comprehensive guide for approaching phenomena observed in electron microscopy from the perspective of diffraction physics.