This work is aimed towards the implementation of a fault-tolerant memory system with the help of supporting circuits. This work demonstrates an improvement on the reliability of a semiconductor memory system using Error control codes (ECC)and Low Density Parity Check (LDPC) Codes as a part of protecting support logic. It is observed that the error correcting codes with higher hamming distances can detect more errors i.e. as higher the hamming distance higher the error control capability.
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Da: BuchWeltWeit Ludwig Meier e.K., Bergisch Gladbach, Germania
Taschenbuch. Condizione: Neu. This item is printed on demand - it takes 3-4 days longer - Neuware -This work is aimed towards the implementation of a fault-tolerant memory system with the help of supporting circuits. This work demonstrates an improvement on the reliability of a semiconductor memory system using Error control codes (ECC)and Low Density Parity Check (LDPC) Codes as a part of protecting support logic. It is observed that the error correcting codes with higher hamming distances can detect more errors i.e. as higher the hamming distance higher the error control capability. 128 pp. Englisch. Codice articolo 9783330044197
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Da: moluna, Greven, Germania
Condizione: New. Dieser Artikel ist ein Print on Demand Artikel und wird nach Ihrer Bestellung fuer Sie gedruckt. Autor/Autorin: S. Murti Sarma N.Asst.Prof.Poluboyina Lavanya and Assoc.Prof.Gobinda Prasad Acharya are upgrowing research scholars of JNTUK and JNTUH in the areas of wireless networks and VLSI testing respectively. N S Murti Sarma together with abo. Codice articolo 158590434
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Da: Revaluation Books, Exeter, Regno Unito
Paperback. Condizione: Brand New. 128 pages. 8.66x5.91x0.29 inches. In Stock. Codice articolo 3330044195
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Da: buchversandmimpf2000, Emtmannsberg, BAYE, Germania
Taschenbuch. Condizione: Neu. This item is printed on demand - Print on Demand Titel. Neuware -This work is aimed towards the implementation of a fault-tolerant memory system with the help of supporting circuits. This work demonstrates an improvement on the reliability of a semiconductor memory system using Error control codes (ECC)and Low Density Parity Check (LDPC) Codes as a part of protecting support logic. It is observed that the error correcting codes with higher hamming distances can detect more errors i.e. as higher the hamming distance higher the error control capability.VDM Verlag, Dudweiler Landstraße 99, 66123 Saarbrücken 128 pp. Englisch. Codice articolo 9783330044197
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Da: Mispah books, Redhill, SURRE, Regno Unito
paperback. Condizione: New. NEW. SHIPS FROM MULTIPLE LOCATIONS. book. Codice articolo ERICA82933300441956
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