Isbn: 9783330044197 - realization of memory fault tolerance using error correcting codes (6 risultati)
Realization of Memory Fault Tolerance using Error Correcting Codes
S. Murti Sarma, N./ Lavanya, Poluboyina/ Prasad Acharya, Gobinda
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Da: Revaluation Books, Exeter, Regno UnitoRevaluation Books
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Paperback. Condizione: Brand New. 128 pages. 8.66x5.91x0.29 inches. In Stock.
Realization of Memory Fault Tolerance using Error Correcting Codes
S. Murti Sarma, N., Lavanya, Poluboyina, Prasad Acharya, Gob
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Da: Mispah books, Redhill, SURRE, Regno UnitoMispah books
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EUR 155,81
EUR 29,54 spedizioneSpedito da Regno Unito a U.S.A.Quantità: 1 disponibile
paperback. Condizione: New. NEW. SHIPS FROM MULTIPLE LOCATIONS. book.
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Da: BuchWeltWeit Ludwig Meier e.K., Bergisch Gladbach, GermaniaBuchWeltWeit Ludwig Meier e.K.
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Taschenbuch. Condizione: Neu. This item is printed on demand - it takes 3-4 days longer - Neuware -This work is aimed towards the implementation of a fault-tolerant memory system with the help of supporting circuits. This work demonstrates an improvement on the reliability of a semiconductor memory system using Error control codes (ECC)and Low Density Parity Check (LDPC) Codes as a part of protecting support logic. It is observed that the error correcting codes with higher hamming distances can detect more errors i.e. as higher the hamming distance higher the error control capability. 128 pp. Englisch.…
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Da: AHA-BUCH GmbH, Einbeck, GermaniaAHA-BUCH GmbH
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EUR 49,90
EUR 35,00 spedizioneSpedito da Germania a U.S.A.Quantità: 1 disponibile
Taschenbuch. Condizione: Neu. nach der Bestellung gedruckt Neuware - Printed after ordering - This work is aimed towards the implementation of a fault-tolerant memory system with the help of supporting circuits. This work demonstrates an improvement on the reliability of a semiconductor memory system using Error control codes (ECC)and Low Density Parity Check (LDPC) Codes as a part of protecting support logic. It is observed that the error correcting codes with higher hamming distances can detect more errors i.e. as higher the hamming distance higher the error control capability.…
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Da: moluna, Greven, Germaniamoluna
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EUR 41,71
EUR 48,99 spedizioneSpedito da Germania a U.S.A.Quantità: Più di 20 disponibili
Condizione: New. Dieser Artikel ist ein Print on Demand Artikel und wird nach Ihrer Bestellung fuer Sie gedruckt. Autor/Autorin: S. Murti Sarma N.Asst.Prof.Poluboyina Lavanya and Assoc.Prof.Gobinda Prasad Acharya are upgrowing research scholars of JNTUK and JNTUH in the areas of wireless networks and VLSI testing respectively. N S Murti Sarma together with abo.…
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Da: buchversandmimpf2000, Emtmannsberg, BAYE, Germaniabuchversandmimpf2000
Contatta il venditoreVenditore con 5 stelleCondizione: Nuovo
EUR 49,90
EUR 60,00 spedizioneSpedito da Germania a U.S.A.Quantità: 1 disponibile
Taschenbuch. Condizione: Neu. This item is printed on demand - Print on Demand Titel. Neuware -This work is aimed towards the implementation of a fault-tolerant memory system with the help of supporting circuits. This work demonstrates an improvement on the reliability of a semiconductor memory system using Error control codes (ECC)and Low Density Parity Check (LDPC) Codes as a part of protecting support logic. It is observed that the error correcting codes with higher hamming distances can detect more errors i.e. as higher the hamming distance higher the error control capability.VDM Verlag, Dudweiler Landstraße 99, 66123 Saarbrücken 128 pp. Englisch.…
