Applied Scanning Probe Methods V: Scanning Probe Microscopy Techniques - Rilegato

Rilegato

ISBN 10: 3540373152 ISBN 13: 9783540373155

Casa editrice: Springer Nature, 2006

Riassunto

The volumes V, VI and VII will examine the physical and technical foundation for recent progress in applied scanning probe techniques. These volumes constitute a timely comprehensive overview of SPM applications. This is the first book summarizing the state-of-the-art of this technique. The chapters are written by leading researchers and application scientists from all over the world and from various industries to provide a broader perspective.

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Contenuti

Integrated Cantilevers and Atomic Force Microscopes.- Electrostatic Microscanner.- Low-Noise Methods for Optical Measurements of Cantilever Deflections.- Q-controlled Dynamic Force Microscopy in Air and Liquids.- High-Frequency Dynamic Force Microscopy.- Torsional Resonance Microscopy and Its Applications.- Modeling of Tip-Cantilever Dynamics in Atomic Force Microscopy.- Combined Scanning Probe Techniques for In-Situ Electrochemical Imaging at a Nanoscale.- New AFM Developments to Study Elasticity and Adhesion at the Nanoscale.- Near-Field Raman Spectroscopy and Imaging.

Product Description

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Dettagli dell'edizione

• Editore: Springer Nature
• Data di pubblicazione: 2006
• Lingua: Inglese
• ISBN 10: 3540373152
• ISBN 13: 9783540373155
• Rilegatura: Copertina rigida
• Numero di pagine: 344
• Redattore: Bhushan Bharat, Fuchs Harald, Kawata Satoshi
• Contatto del produttore: GPSR Kontakt; ProductSafety@springernature.com; ; Uhlandstraße 14; Stuttgart; 70182; Germania