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9783540373155 - Applied Scanning Probe Methods V: Scanning Probe Microscopy Techniques (21 risultati)
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Applied Scanning Probe Methods V: Scanning Probe Microscopy Techniques (NanoScience and Technology)
Da: Zubal-Books, Since 1961, Cleveland, OH, U.S.A.
Valutazione del venditore 5 su 5 stelle
Condizione: Fine. *Price HAS BEEN REDUCED by 10% until Monday, June 22 (weekend SALE item)* xlv, 344 pp., Hardcover, a tiny scuff to bottom edge of back cover else fine. - If you are reading this, this item is actually (physically) in our stock and ready for shipment once ordered. We are not bookjackers. Buyer is responsible for any additional duties, taxes, or fees required by recipient's country.
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Applied Scanning Probe Methods V
Da: Basi6 International, Irving, TX, U.S.A.
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Condizione: Brand New. New. US edition. Expediting shipping for all USA and Europe orders excluding PO Box. Excellent Customer Service.
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Applied Scanning Probe Methods V: Scanning Probe Microscopy Techniques (NanoScience and Technology)
Da: Phatpocket Limited, Waltham Abbey, HERTS, Regno Unito
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EUR 35,49
Spedizione EUR 12,27
Spedito da Regno Unito a U.S.A.Quantità: 1 disponibili
Aggiungi al carrelloCondizione: Good. Your purchase helps support Sri Lankan Children's Charity 'The Rainbow Centre'. Ex-library, so some stamps and wear, but in good overall condition. Our donations to The Rainbow Centre have helped provide an education and a safe haven to hundreds of children who live in appalling conditions.
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Applied Scanning Probe Methods V. Scanning Probe Microscopy Techniques.
Da: Universitätsbuchhandlung Herta Hold GmbH, Berlin, Germania
Membro dell'associazione: GIAQ ILAB VDA
Valutazione del venditore 4 su 5 stelle
EUR 22,00
Spedizione EUR 30,00
Spedito da Germania a U.S.A.Quantità: 1 disponibili
Aggiungi al carrello194 fig., 12 tabs., XLV, 344 p. Hardcover. Versand aus Deutschland / We dispatch from Germany via Air Mail. Einband bestoßen, daher Mängelexemplar gestempelt, sonst sehr guter Zustand. Imperfect copy due to slightly bumped cover, apart from this in very good condition. Stamped. NanoScience and Technology. Sprache: Englisch.
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Applied Scanning Probe Methods V
Da: Books Puddle, New York, NY, U.S.A.
Valutazione del venditore 4 su 5 stelle
Condizione: New. pp. xlvi + 344 1st Edition.
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Applied Scanning Probe Methods V: Scanning Probe Microscopy Techniques
Da: Romtrade Corp., STERLING HEIGHTS, MI, U.S.A.
Valutazione del venditore 5 su 5 stelle
Condizione: New. This is a Brand-new US Edition. This Item may be shipped from US or any other country as we have multiple locations worldwide.
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Applied Scanning Probe Methods V: Scanning Probe Microscopy Techniques
Da: Basi6 International, Irving, TX, U.S.A.
Valutazione del venditore 5 su 5 stelle
Condizione: Brand New. New. US edition. Expediting shipping for all USA and Europe orders excluding PO Box. Excellent Customer Service.
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Condizione: New. Brand New Original US Edition. Customer service! Satisfaction Guaranteed.
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Applied Scanning Probe Methods V
Da: Romtrade Corp., STERLING HEIGHTS, MI, U.S.A.
Valutazione del venditore 5 su 5 stelle
Condizione: New. This is a Brand-new US Edition. This Item may be shipped from US or any other country as we have multiple locations worldwide.
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Applied Scanning Probe Methods V
Da: Basi6 International, Irving, TX, U.S.A.
Valutazione del venditore 5 su 5 stelle
Condizione: Brand New. New. US edition. Expediting shipping for all USA and Europe orders excluding PO Box. Excellent Customer Service.
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Edizione InternazionaleAPPLIED SCANNING PROBE METHODS V SCANNING PROBE MICROSCOPY TECHNIQUES (HB 2007)
Da: UK BOOKS STORE, London, LONDO, Regno Unito
Valutazione del venditore 5 su 5 stelle
EUR 109,52
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Spedito da Regno Unito a U.S.A.Quantità: 5 disponibili
Aggiungi al carrelloCondizione: New. Brand New! Fast Delivery This is an International Edition and ship within 24-48 hours. Deliver by FedEx and Dhl, & Aramex, UPS, & USPS and we do accept APO and PO BOX Addresses. Order can be delivered worldwide within 6-10 days and we do have flat rate for up to 2LB. Extra shipping charges will be requested if the Book weight is more than 5 LB. This Item May be shipped from India, United states & United Kingdom. Depending on your location and availability.
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Applied Scanning Probe Methods V
Da: Biblios, Frankfurt am main, HESSE, Germania
Valutazione del venditore 4 su 5 stelle
EUR 106,23
Spedizione EUR 9,95
Spedito da Germania a U.S.A.Quantità: 1 disponibili
Aggiungi al carrelloCondizione: New. pp. xlvi + 344.
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APPLIED SCANNING PROBE METHODS V (NANOSCIENCE AND TECHNOLOGY)
Da: Basi6 International, Irving, TX, U.S.A.
Valutazione del venditore 5 su 5 stelle
Condizione: Brand New. New. US edition. Expediting shipping for all USA and Europe orders excluding PO Box. Excellent Customer Service.
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Applied Scanning Probe Methods V: Scanning Probe Microscopy Techniques (NanoScience and Technology)
Da: Ria Christie Collections, Uxbridge, Regno Unito
Valutazione del venditore 5 su 5 stelle
EUR 163,72
Spedizione EUR 13,81
Spedito da Regno Unito a U.S.A.Quantità: Più di 20 disponibili
Aggiungi al carrelloCondizione: New. In.
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Applied Scanning Probe Methods V : Scanning Probe Microscopy Techniques
Da: GreatBookPrices, Columbia, MD, U.S.A.
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Condizione: New.
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Applied Scanning Probe Methods V : Scanning Probe Microscopy Techniques
Da: GreatBookPrices, Columbia, MD, U.S.A.
Valutazione del venditore 5 su 5 stelle
Condizione: As New. Unread book in perfect condition.
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Applied Scanning Probe Methods V : Scanning Probe Microscopy Techniques
Lingua: Inglese
Editore: Springer Berlin Heidelberg, Springer Berlin Heidelberg, 2006
ISBN 10: 3540373152 ISBN 13: 9783540373155
EUR 160,49
Spedizione EUR 63,76
Spedito da Germania a U.S.A.Quantità: 1 disponibili
Aggiungi al carrelloBuch. Condizione: Neu. Druck auf Anfrage Neuware - Printed after ordering - The scanning probe microscopy eld has been rapidly expanding. It is a demanding task to collect a timely overview of this eld with an emphasis on technical dev- opments and industrial applications. It became evident while editing Vols. I-IV that a large number of technical and applicational aspects are present and rapidly - veloping worldwide. Considering the success of Vols. I-IV and the fact that further colleagues from leading laboratories were ready to contribute their latest achie- ments, we decided to expand the series with articles touching elds not covered in the previous volumes. The response and support of our colleagues were excellent, making it possible to edit another three volumes of the series. In contrast to to- cal conference proceedings, the applied scanning probe methods intend to give an overview of recent developments as a compendium for both practical applications and recent basic research results, and novel technical developments with respect to instrumentation and probes. The present volumes cover three main areas: novel probes and techniques (Vol. V), charactarization (Vol. VI), and biomimetics and industrial applications (Vol. VII). Volume V includes an overview of probe and sensor technologies including integrated cantilever concepts, electrostatic microscanners, low-noise methods and improved dynamic force microscopy techniques, high-resonance dynamic force - croscopy and the torsional resonance method, modelling of tip cantilever systems, scanning probe methods, approaches for elasticity and adhesion measurements on the nanometer scale as well as optical applications of scanning probe techniques based on near eld Raman spectroscopy and imaging.
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Applied Scanning Probe Methods V
Da: Majestic Books, Hounslow, Regno Unito
Valutazione del venditore 4 su 5 stelle
EUR 78,29
Spedizione EUR 7,50
Spedito da Regno Unito a U.S.A.Quantità: 1 disponibili
Aggiungi al carrelloCondizione: New. pp. xlvi + 344 Illus. This item is printed on demand.
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Applied Scanning Probe Methods V. Vol.5
Lingua: Inglese
Editore: Springer Berlin Heidelberg, 2006
ISBN 10: 3540373152 ISBN 13: 9783540373155
EUR 132,75
Spedizione EUR 48,99
Spedito da Germania a U.S.A.Quantità: Più di 20 disponibili
Aggiungi al carrelloGebunden. Condizione: New. Dieser Artikel ist ein Print on Demand Artikel und wird nach Ihrer Bestellung fuer Sie gedruckt. First book summarizing the state-of-the-art of this techniqueReal industrial applications includedThe volumes V, VI and VII will examine the physical and technical foundation for recent progress in applied scanning probe techniques. The.
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Applied Scanning Probe Methods V
Lingua: Inglese
Editore: Springer Berlin Heidelberg Okt 2006, 2006
ISBN 10: 3540373152 ISBN 13: 9783540373155
Da: BuchWeltWeit Ludwig Meier e.K., Bergisch Gladbach, Germania
Valutazione del venditore 5 su 5 stelle
EUR 160,49
Spedizione EUR 23,00
Spedito da Germania a U.S.A.Quantità: 2 disponibili
Aggiungi al carrelloBuch. Condizione: Neu. This item is printed on demand - it takes 3-4 days longer - Neuware -The volumes V, VI and VII will examine the physical and technical foundation for recent progress in applied scanning probe techniques. These volumes constitute a timely comprehensive overview of SPM applications. This is the first book summarizing the state-of-the-art of this technique. The chapters are written by leading researchers and application scientists from all over the world and from various industries to provide a broader perspective. 392 pp. Englisch.
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Applied Scanning Probe Methods V
Lingua: Inglese
Editore: Springer Berlin Heidelberg, Springer Berlin Heidelberg Okt 2006, 2006
ISBN 10: 3540373152 ISBN 13: 9783540373155
Da: buchversandmimpf2000, Emtmannsberg, BAYE, Germania
Valutazione del venditore 5 su 5 stelle
EUR 160,49
Spedizione EUR 60,00
Spedito da Germania a U.S.A.Quantità: 1 disponibili
Aggiungi al carrelloBuch. Condizione: Neu. This item is printed on demand - Print on Demand Titel. Neuware -The scanning probe microscopy eld has been rapidly expanding. It is a demanding task to collect a timely overview of this eld with an emphasis on technical dev- opments and industrial applications. It became evident while editing Vols. I¿IV that a large number of technical and applicational aspects are present and rapidly - veloping worldwide. Considering the success of Vols. I¿IV and the fact that further colleagues from leading laboratories were ready to contribute their latest achie- ments, we decided to expand the series with articles touching elds not covered in the previous volumes. The response and support of our colleagues were excellent, making it possible to edit another three volumes of the series. In contrast to to- cal conference proceedings, the applied scanning probe methods intend to give an overview of recent developments as a compendium for both practical applications and recent basic research results, and novel technical developments with respect to instrumentation and probes. The present volumes cover three main areas: novel probes and techniques (Vol. V), charactarization (Vol. VI), and biomimetics and industrial applications (Vol. VII). Volume V includes an overview of probe and sensor technologies including integrated cantilever concepts, electrostatic microscanners, low-noise methods and improved dynamic force microscopy techniques, high-resonance dynamic force - croscopy and the torsional resonance method, modelling of tip cantilever systems, scanning probe methods, approaches for elasticity and adhesion measurements on the nanometer scale as well as optical applications of scanning probe techniques based on near eld Raman spectroscopy and imaging.Springer-Verlag GmbH, Tiergartenstr. 17, 69121 Heidelberg 392 pp. Englisch.
